Helmut-Fischer Fischerscope XDAL Energy Dispersive X-Ray Fluorescence Spectrometer
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  • Fischerscope_XDALFD_Series_View2
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Helmut-Fischer Fischerscope XDAL Energy Dispersive X-Ray Fluorescence Spectrometer

Features

  • Universal, Non-Destructive Element Analysis
  • Ideal for Small Structures and Thin Coatings
  • Very Good Analysis Results Even with Low Element Concentrations
  • Silicon PIN Detector
  • Large Easy-Access Measurement Chamber
  • Quickly Programmable XY-Stage and Moveable Z-Axis
  • Operator Support Through Video Image and Laser Pointer

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This Helmut-Fischer Fischerscope XDAL-FD EDXRF Spectrometer is used and in excellent condition.

Configuration:
• FD: Fast Detector
• Tube: Micro
• Detector: PIN
• Filters: 3
• Aperture: 4
• Probe Placing: XYZ
• CPU: 1.8 Ghz P4, 1GB RAM, 20GB HDD, Windows XP, XDAL-FT Software v6.19 with Monitor, Keyboard and Mouse

Input Voltage: 120 VAC Only

Click here to view the photo of a wafer taken with the device's on-board camera by an Artisan Technology Group technician.

Parts and Accessories:
• (1) FI-SIM WinFTM Super X720 (Security USB Dongle)
• (3) WINFTM V6 CDs (Version: 6.13, 6.14, 6.19)
• (1) Serial Cable for connecting device to computer
• (1) Video Cable for camera

Click here to view a photo of the parts and accessories.





  • Description
  • Tech Specs
  • Datasheets / Manuals 
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Description

The Helmut-Fischer Fischerscope XDAL is the universal spectrometer in the XDL series. It is the right tool for the fast, non-destructive material and coating analysis with a small measurement locations and/or thin coatings. This makes it ideal to examine unknown materials, such as in the incoming inspection or for material analysis. It also finds a permanent place in the laboratory, in quality assurance as well as in research and development.

The X-ray source is a micro focus tube that offers a high excitation of the material sample even with a small measurement spot. With the XDAL, apertures and filters can be changed with a click of the mouse via the operating software in order to create the optimum excitation conditions for different measuring applications. For a high resolution combined with a short measuring time, a Peltier-cooled silicon PIN detector is used. With it, elements from aluminum to uranium can be detected even with very low material concentrations and very thin coatings.

The Fischerscope X-RAY XDAL has a voluminous measurement chamber and is easy to use. For large, flat samples such as PCBs, the housing has openings on the side. But the instrument is also suitable for large specimens with complex shapes. For this purpose, it is equipped with a motorized Z-axis that can be adjusted by 140 mm. The wide-opening hood allows for easy access to the measurement chamber. Because the XY-stage travels automatically to the loading position when the hood is opened, quickly placing the sample is extremely easy. A laser pointer shows the exact measuring position on the specimen. A high-resolution and high-magnification color video camera with auto-focus zooms at the measuring spot with a magnification of up to 180x and thus enables the precise definition of the measurement spot.

With the fast, programmable XY-stage, surfaces can be examined easily in the mapping mode. Also, serial measurements of components, e.g., lead frames, or the measurement of several, even different components can be programmed and executed automatically with ease.

Product Family: XDAL, XDL, XDAL-FD, XDALFD, X-DAL
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Specifications

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Resources

Manuals, Datasheets, Drivers, Links

Helmut-Fischer Fischerscope XDAL Datasheet (pdf) 
Link to Helmut-Fischer Website