--- type: product schema_version: 1 stock_number: "50757-5" canonical_url: "https://www.artisantg.com/50757-5/MKS-Instruments-355400-0-YH-T-00088" json_url: "https://www.artisantg.com/50757-5/MKS-Instruments-355400-0-YH-T-00088.json" generated_at: "2026-11-07T09:15:07.721Z" last_updated: "2026-10-14T13:00:51.160-05:00" --- # MKS Instruments / Granville-Phillips 355400-0-YH-T-00088 Micro-Ion Hot Cathode Transducer _Summary and Categories are this item's record. The description sections and FAQ are machine-assisted and can contain errors; where they disagree with the record, the record is correct, and where description sections disagree with each other, Details wins._ ## Summary - Manufacturer: MKS Instruments - Model: 355400-0-YH-T-00088 - Condition: Used and in Excellent Condition - Price: Quote only - Availability: Not in Stock - Warranty: 1-Year Warranty with 30-Day Return Guarantee - ITAR restricted: No - Shipping weight: 1.5 lb, estimated - Shipping dimensions: 8X8X3 in, estimated ## Categories - Industrial Systems Equipment > Sensors and Transducers > Transducers (primary) ## Details This unit does not have a gauge. Please contact the manufacturer for availability and pricing. ### Configuration - Series: 355 Micro-Ion Transducer - Display: Without Display - Interface: Analog - Relay Set Points: No Relay Set Points (Analog Only) - Filaments: Yttria-Coated Iridium - Flange/Fitting: 1/2 inch VCR-type male - Measurement Units: Torr - Third Party Specific Configuration: 00088 Part Number: 355400-0-YH-T ## Function Hot cathode ionization vacuum transducer utilizing yttria-coated iridium filaments to measure ultra-high vacuum levels from 10^-11 to 10^-3 Torr through electron impact ionization of residual gas molecules. Features analog output interface for continuous pressure monitoring without integrated display. Connects via 1/2 inch VCR-type male fitting for direct mounting to vacuum systems. Designed for high vacuum applications requiring precise pressure measurement in molecular beam epitaxy, surface analysis, and semiconductor processing environments. ## Images - - - -