--- type: product schema_version: 1 stock_number: "60222-11" canonical_url: "https://www.artisantg.com/60222-11/Cirris-Systems-AHED-34" json_url: "https://www.artisantg.com/60222-11/Cirris-Systems-AHED-34.json" generated_at: "2026-11-07T09:13:36.175Z" last_updated: "2026-10-14T13:00:51.160-05:00" --- # Cirris Systems AHED-34 Dual Row Eject Latch Header Male Adapter _Summary and Categories are this item's record. The description sections and FAQ are machine-assisted and can contain errors; where they disagree with the record, the record is correct, and where description sections disagree with each other, Details wins._ ## Summary - Manufacturer: Cirris Systems - Model: AHED-34 - Condition: Used and in Good Condition - Price: $145.00 USD - Availability: In stock, 1 available - Warranty: 1-Year Warranty with 30-Day Return Guarantee - ITAR restricted: No - Shipping weight: 1 lb, estimated - Shipping dimensions: 8X8X3 in, estimated ## Categories - Test Equipment > Electrical Test > Adapters (primary) ## Details This unit has chipped connector. ### Configuration - Number of Positions: 34 View Photo of chipped connector. Part Number: 1E67F0 ## Overview Adapter designed to mate with dual row eject latch header connectors with 0.1” x 0.1” (2.54mm x 2.54mm) pin spacing; provides a male connection interface suitable for test fixturing systems; typically used to connect ribbon cables or test equipment in automated test setups; offers secure latch mechanism for reliable connection and serviceability; commonly used with 34-position configurations; compatible with Cirris test platforms and accessories for electrical continuity, isolation, and functional testing. ## Function Adapts a cable/harness test system's interface to a 34-position, dual-row male header with ejector latches. This fixture enables the tester to mate with a female insulation-displacement connector (IDC) on a ribbon cable assembly. It facilitates automated electrical testing, including continuity, insulation resistance, and component verification, for a specific Device Under Test (DUT) termination. ## Platform Designed for automated test equipment and cable harness testing systems requiring secure dual-row connector interfaces with positive retention mechanisms. Operates within standard rack-mounted test fixtures and production line environments. Interfaces with pneumatic or manual ejector mechanisms for rapid connection cycling during high-volume testing applications. Compatible with ribbon cable assemblies and multi-conductor harnesses in aerospace, automotive, and telecommunications manufacturing quality assurance processes. ## Application Interfaces dual-row eject latch headers to test equipment via a custom adapter designed to maintain signal integrity and reliable connections during functional electrical testing of electronic assemblies or cable harnesses. Compatible with automated test systems, it facilitates quick mating and demating of header pins to probes or test fixtures, ensuring accurate digital and analog signal transmission in manufacturing test environments, quality assurance labs, and electronic system diagnostics. ## Accessories Requires compatible automated cable test system as the host platform such as Cirris 1100R+ or CH2. The AHED-34 is a dual-row 34-pin male header adapter with eject latches for IDC ribbon cable connections. Features 0.1" pitch pins arranged in two rows, compatible with standard 34-conductor ribbon cables using IDC connectors. Latching mechanism allows secure connection and easy release. Mounts to Cirris test fixtures using standard adapter mounting holes. ## Interface Dual row eject latch header male connector with 0.1” x 0.1” (2.54mm x 2.54mm) pitch, 34 positions; designed for secure cable mating with latch mechanism; mates with 34-position female ribbon cable connectors; physical interface includes two rows of 17 male pins each, arranged on a standard 2.54mm spacing grid. Compatible adapter part numbers include HHED-34. Typically used with Cirris ribbon cables AC20-34, AC40-34, AC60-34, AC80-34 in lengths from 2 to 8 feet. ## Images - - - -