--- type: product schema_version: 1 stock_number: "60222-3" canonical_url: "https://www.artisantg.com/60222-3/Cirris-Systems-AHED-60" json_url: "https://www.artisantg.com/60222-3/Cirris-Systems-AHED-60.json" generated_at: "2026-11-07T16:24:24.113Z" last_updated: "2026-10-14T13:00:51.160-05:00" --- # Cirris Systems AHED-60 Dual Row Eject Latch Header Male Adapter _Summary and Categories are this item's record. The description sections and FAQ are machine-assisted and can contain errors; where they disagree with the record, the record is correct, and where description sections disagree with each other, Details wins._ ## Summary - Manufacturer: Cirris Systems - Model: AHED-60 - Condition: Used and in Excellent Condition - Price: $145.00 USD - Availability: In stock, 1 available - Warranty: 1-Year Warranty with 30-Day Return Guarantee - ITAR restricted: No - Shipping weight: 1 lb, estimated - Shipping dimensions: 8X8X3 in, estimated ## Categories - Test Equipment > Electrical Test > Adapters (primary) ## Details ### Configuration - Number of Positions: 60 Part Number: 711421 ## Overview An interchangeable test adapter for automated cable and harness test systems. It provides a 60-pin, dual-row male header interface with ejector latches for secure, quick connection to a Device Under Test (DUT) terminating in a 60-position female IDC ribbon cable connector. This hardware enables rapid continuity, short-circuit, and mis-wire testing in production and quality assurance environments for electronic assemblies. It is designed to mate with the tester's main interface grid or connector panel, facilitating high-volume testing of specific cable harnesses. ## Function Facilitates connection of test leads to dual row headers, providing reliable interface during harness testing. Suitable for integrating into continuity and hi-pot testing systems, offering secure mechanical and electrical contact. Supports current ratings consistent with standard wire harness requirements. Designed for seamless latching and unlatching without damage to test leads or headers. Compatible with industry-standard pin spacing and various connector types. ## Platform Dual row ejecting latch header male adapter used in electrical wiring and continuity testing systems, designed to interface with automatic cable testing equipment for quality control in manufacturing environments. Connects to dual row header plugs with latch ejection mechanisms, enabling secure mating with corresponding connectors during testing procedures. Integrates with automated testing platforms for detecting connection faults, shorts, miswires, and opens in electrical assemblies. Compatible with various wire harness testing systems and computer-controlled testing equipment in electronics production facilities. ## Application Interface for automated continuity, high-voltage (HiPot), and component testing of cable assemblies and harnesses. Designed for connecting a test system to a device under test (DUT) that utilizes a 60-position dual-row female insulation-displacement connector (IDC). Enables rapid verification of pinouts, insulation integrity, and embedded passive components in manufacturing, quality control, and prototyping applications. ## Accessories Interfaces: 60-pin (2x30) 2.54mm pitch dual-row male header with eject latches, designed to mate with a 60-pin female IDC socket connector for test cables/DUTs. Second interface is a proprietary multi-pin connector for connection to a Cirris Systems cable tester mainframe. Required associated equipment: Cirris Systems cable tester. ## Interface 60-pin dual row connector; accommodates 0.1-inch spacing; compatible with test machines, facilitating interface for male connection through an eject latch system. ## Images - - - -