--- type: product schema_version: 1 stock_number: "60222-4" canonical_url: "https://www.artisantg.com/60222-4/Cirris-Systems-AHED-50" json_url: "https://www.artisantg.com/60222-4/Cirris-Systems-AHED-50.json" generated_at: "2026-11-07T11:05:36.334Z" last_updated: "2026-10-14T13:00:51.160-05:00" --- # Cirris Systems AHED-50 Dual Row Eject Latch Header Male Adapter _Summary and Categories are this item's record. The description sections and FAQ are machine-assisted and can contain errors; where they disagree with the record, the record is correct, and where description sections disagree with each other, Details wins._ ## Summary - Manufacturer: Cirris Systems - Model: AHED-50 - Condition: Used and in Good Condition - Price: $145.00 USD - Availability: In stock, 1 available - Warranty: 1-Year Warranty with 30-Day Return Guarantee - ITAR restricted: No - Shipping weight: 1 lb, estimated - Shipping dimensions: 8X8X3 in, estimated ## Categories - Test Equipment > Electrical Test > Adapters (primary) ## Details This unit has a splintered PCB. ### Configuration - Number of Positions: 60 View Photo of splintered PCB. Part Number: F2FE01 ## Overview The AHED-50 is a male adapter designed to interface with dual-row eject latch headers, facilitating electrical connections via a 50-pin configuration. It operates within automated test equipment environments, providing a secure and reliable interface for high-volume cable and harness testing. The adapter connects to test systems via industry-standard connectors, enabling continuity, insulation resistance, and hipot testing. ## Function Provides a passive electromechanical test point interface for an automated cable/harness test system. The adapter presents a 50-position, 0.100-inch pitch, dual-row male header with ejector latches for secure, keyed mating with a female IDC ribbon cable connector from a device under test. This enables automated electrical testing for continuity, shorts, opens, and miswires. ## Platform Designed for integration with Cirris benchtop test systems including Easy-Touch Pro, 4250, and 4200 testers; interfaces mechanically and electrically via a 0.1” x 0.1” (2.54mm) dual row eject latch header male connector, serving as a replaceable wear item adapter to connect and test cables and harnesses; supports quick changeover and reliable electrical contact within Cirris modular test hardware configurations. ## Application Connects dual row eject latch headers to wire harness testers for automated electrical testing of multi-conductor cable assemblies. Functions as an interface adapter between the tester's points system and male pin headers with latching mechanisms. Enables verification of continuity, shorts, miswires, and insulation resistance in electronic harnesses, particularly those with dual row configurations. Used in quality control processes for automotive, aerospace, industrial control, and telecommunications systems where reliable connection verification is essential. ## Accessories Requires Cirris tester mainframe. DUT Interface: One 50-pin (2x25) male shrouded header with ejector latches for mating with a female IDC ribbon cable connector. Tester Interface: One 64-pin female DIN 41612 Type C connector for connection to the Cirris tester backplane. ## Interface Dual row, eject latch header, male, 50-pin, 0.100" spacing ## Images - - - -