--- type: product schema_version: 1 stock_number: "89047-2" canonical_url: "https://www.artisantg.com/89047-2/Chroma-36010" json_url: "https://www.artisantg.com/89047-2/Chroma-36010.json" generated_at: "2026-11-07T02:08:15.285Z" last_updated: "2026-10-14T13:00:51.160-05:00" --- # Chroma 36010 Programmable Pin Electronics Card _Summary and Categories are this item's record. The description sections and FAQ are machine-assisted and can contain errors; where they disagree with the record, the record is correct, and where description sections disagree with each other, Details wins._ ## Summary - Manufacturer: Chroma - Model: 36010 - Condition: Used and in Excellent Condition - Price: $150.00 USD - Availability: In stock, 1 available - Warranty: 1-Year Warranty with 30-Day Return Guarantee - ITAR restricted: No - Shipping weight: 4 lb, estimated - Shipping dimensions: 12X9X6 in, estimated ## Categories - Test Equipment > Electrical Test > IC Testers (primary) - Military and Embedded Equipment > Embedded & Industrial > Other Modular - Semiconductor > Semiconductor ## Details This unit is Version 5(3). ## Function Provides programmable stimulus and measurement capabilities for semiconductor device testing by interfacing with automatic test equipment (ATE) systems; supports pin-level control including digital pattern driving, voltage/current sourcing, and signal acquisition; connects via high-density pin interfaces to device under test (DUT) sockets or fixtures; enables customizable test conditions for parametric, functional, and timing verification in IC production and validation environments. ## Platform A pin electronics card that integrates into automated test equipment (ATE) for semiconductor testing, providing programmable I/O channels with adjustable voltage and current parameters. Interfaces with device-under-test (DUT) through high-density connectors and communicates with test system controller via backplane bus architecture. Supports multiple test formats including digital pattern testing, parametric measurements, and functional verification. Compatible with modular test systems requiring high-speed, precision signal handling for integrated circuit characterization across development and production environments. ## Application Designed to interface with automatic test systems, this programmable pin electronics card provides configurable voltage and current sourcing and measurement capabilities. It operates within a PXI, connecting to device pins under test to perform parametric and functional testing. It supports DUT interface via high-density connectors and integrates with test software for voltage forcing, current measurement, timing, and sequencing. Common applications include semiconductor device characterization, parametric testing, and component-level functional validation. ## Images - - - -