--- type: product schema_version: 1 stock_number: "89047-3" canonical_url: "https://www.artisantg.com/89047-3/Chroma-36010" json_url: "https://www.artisantg.com/89047-3/Chroma-36010.json" generated_at: "2026-11-07T02:09:52.251Z" last_updated: "2026-10-14T13:00:51.160-05:00" --- # Chroma 36010 Programmable Pin Electronics Card _Summary and Categories are this item's record. The description sections and FAQ are machine-assisted and can contain errors; where they disagree with the record, the record is correct, and where description sections disagree with each other, Details wins._ ## Summary - Manufacturer: Chroma - Model: 36010 - Condition: Used and in Excellent Condition - Price: $150.00 USD - Availability: In stock, 1 available - Warranty: 1-Year Warranty with 30-Day Return Guarantee - ITAR restricted: No - Shipping weight: 3 lb, estimated - Shipping dimensions: 8X8X3 in, estimated ## Categories - Test Equipment > Electrical Test > IC Testers (primary) - Military and Embedded Equipment > Embedded & Industrial > Other Modular - Semiconductor > Semiconductor ## Details This unit is Version 6(3) and has jumpers installed on the connector side. ## Function Provides high-speed, programmable digital and mixed-signal stimulus and response capabilities for device under test (DUT) pins. Features include independent voltage/current drive and measure, accurate timing generation and capture, level translation, and error detection, all configurable for comprehensive functional and parametric testing. ## Platform The 36010 card functions as a programmable pin electronics module, designed for deployment in automated test equipment (ATE) systems. It operates on a PXI platform, interfacing with a chassis backplane for power and communication. Connectivity includes digital I/O pins for device under test (DUT) interface, and utilizes digital-to-analog converters (DACs) and analog-to-digital converters (ADCs) for waveform generation and acquisition. Common applications are semiconductor testing and characterization. ## Application Designed for automated test systems, this programmable pin electronics card facilitates precise signal generation and measurement for digital and mixed-signal device testing within automated test equipment (ATE) platforms. It interfaces with device handlers and test controllers, supporting high-speed functional testing, parametric measurements, and fault diagnostics in semiconductor manufacturing and quality assurance environments. ## Images - - - -