--- type: product schema_version: 1 stock_number: "89047-4" canonical_url: "https://www.artisantg.com/89047-4/Chroma-36010" json_url: "https://www.artisantg.com/89047-4/Chroma-36010.json" generated_at: "2026-11-07T02:09:52.540Z" last_updated: "2026-10-14T13:00:51.160-05:00" --- # Chroma 36010 Programmable Pin Electronics Card _Summary and Categories are this item's record. The description sections and FAQ are machine-assisted and can contain errors; where they disagree with the record, the record is correct, and where description sections disagree with each other, Details wins._ ## Summary - Manufacturer: Chroma - Model: 36010 - Condition: Used and in Excellent Condition - Price: $150.00 USD - Availability: In stock, 1 available - Warranty: 1-Year Warranty with 30-Day Return Guarantee - ITAR restricted: No - Shipping weight: 3.5 lb, estimated - Shipping dimensions: 12X9X6 in, estimated ## Categories - Test Equipment > Electrical Test > IC Testers (primary) - Military and Embedded Equipment > Embedded & Industrial > Other Modular - Semiconductor > Semiconductor ## Details This unit is Version 6(3) and has jumpers installed on the opposite side of the connector. ## Function Delivers programmable pin electronics functionality for automatic test equipment in semiconductor testing. Provides multiple high-speed digital channels with configurable voltage levels, timing parameters, and load conditions. Features programmable drive strength, slew rate control, and precision measurement capabilities for both digital and analog signals. Supports various communication protocols and test patterns for comprehensive device characterization. Enables high-throughput parallel testing of integrated circuits with precise timing control and measurement accuracy. ## Platform Semiconductor automatic test equipment ATE systems requiring high-speed digital pattern generation and capture with programmable voltage levels and timing control. Interfaces through standard ATE mainframe backplane connections supporting multi-site parallel device testing. Operates with test head electronics in production and engineering environments for IC functional verification, parametric testing, and failure analysis applications. ## Application Designed for precision testing in semiconductor automated test equipment (ATE) systems, particularly for integrated circuit (IC) testing, including digital and mixed-signal devices. Features configurable pin drivers and analyzers for executing test patterns and measuring response, supporting parametric and functional testing. Offers high-speed digital logic capabilities and can interface with device under test (DUT) through high-density pin connections. Commonly used in IC manufacturing for quality assurance, production testing, and evaluation of digital-analog conversion characteristics. ## Images - - - -