HDI Instrumentation IPS-6000 / SRA-FA Hard Disk Surface Reflectance Analyzer and Controller
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HDI Instrumentation IPS-6000 / SRA-FA Hard Disk Surface Reflectance Analyzer and Controller



This HDI Instrumentation IPS-6000 / SRA-FA Hard Disk Surface Reflectance Analyzer and Controller is used and in excellent condition. The unit comes in two parts, the controller-processor unit, and the hard drive platter surface analyzer. All the necessary cables needed to operate this instrument are included. The software needed to run is loaded onto the system hard drive. Upon request, a Ghost Image of the hard disk can be provided by Artisan Technology Group for system software backup and restore.

An Artisan Technology Group technician and Engineer tested this system and successfully ran many types of scans on spare hard disk platters from our lab that were scratched and scribed. The results of theses tests as well as their interaction with the system's software was well documented. This document was created for download by our technicians:

HDI SRA FA Test Results and Function Document Made by ATG Technicians (pdf)

The system is easy to run, and there are program help files to assist. Tests available run from the extensive (slow) to faster quick checks. This instrument was decommissioned from an active production environment.

Processor Controller Unit:
Model: IPS-6000
Part Number: 1000-0051
Input Voltage: 240 V
Operating System: Windows 2000 Professional

Hard Disk Analyzer:
Model: SRA-FA




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Stock # 61355-1
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HDI Instrumentation IPS-6000 / SRA-FA Hard Disk Surface Reflectance Analyzer and Controller

Features
  • Extensive User-Definable Pass/Fail Parameter Testing
  • All Optical - Non-Contact Testing
  • Checks for Integrity of Hard Disk Platters
  • User-Specific Range Settings
  • Automated Scribing for Testing
  • Made for High-Throughput Production Environment
  • 0.1 Micron x 0.003 Degree Precision
  • Airbearing Spindle

Description

The HDI Instrumentation IPS-6000, coupled with the SRA-FA, allows for full Hard Disc surface analysis in a matter of seconds. The analysis process can detect carbon wear, roll off, wafer defects, waviness, and more within user set parameters across the entire surface of a substrate. To check for accuracy in the measurement process, the SRA-FA can scribe marks into a disk platter and the user can manually calibrate off the scribed markings. The SRA can handle most every kind of substrate material and is excellent for: detection, classification and mapping of residues, stains, pits, bumps, contamination and other types of defects left from a substrate cleaning process. Visually displays surface variation for most any type of coating material and deposition process, using simultaneous S, P, Phase, and Scattered light acquisition.

This HDI system is capable of optically scanning, in a matter of seconds, the entire surface of a substrate providing measurement data and visual images of a wide range of surface properties. The SRA can handle most every kind of substrate material and are excellent for: Detection, classification and mapping of residues, stains, pits, bumps, contamination and other types of defects left from a substrate cleaning process Detection, classification and mapping of residues, scratches and particles left from a substrate polishing process Measurement of the thickness and other characteristics of a deposited coating and visually displaying coating uniformity variations, for most any type of coating material and deposition process Detection and measurement of surface smoothness/waviness and variations Inspection and detection of surface tribology performance problems and issues HDI instruments are widely used in Research and Development, failure analysis, incoming inspection and manufacturing process control.

SRA-FA:

• Multi-channel, full surface scans in less than 10 seconds
• Patented temperature stabilized laser technology
• Sub-Angstrom sensitivity to overcoat and lubricant variations
• 0.1 micron x 0.003 degree precision
• 3.2 micron resolution
• Airbearing spindle with integrated vacuum clamp for fast load/unload of disks
• Macro programming
• Pushbutton operation with auto-analysis
• Automated system calibration
• Extensive 16-Bit image display and analysis package with v
• X-Y data display (ring format) and R-theta data display (flat format)
• 1d and 2d histogram and Fourier analysis of data
• Image math, filtering, and flattening
• Linegraphs, track and angular averaged data expressed in % reflectivity or Angstrom
• Text and bitmap output options

User selectable limits for manufacturing process control of:

• Overcoat thickness and optical properties
• Substrate brightness and optical properties
• Fourier and statistical uniformity analysis
• Defect, stain, and handling damage detection


Product Family: IPS-6000, IPS6000, IPS 6000, SRA FA, SRA-FA, SRAFA, UMC8000, UMC-8000, UMC 8000


Important Notice: Please note that any additional items included with this equipment such as accessories, manuals, cables, calibration data, software, etc. are specifically listed in the above stock item description and/or displayed in the photos of the equipment. Please contact one of our Customer Support Specialists if you have any questions about what is included with this equipment or if you require any additional information.


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HDI Instrumentation IPS-6000 / SRA-FA Hard Disk Surface Reflectance Analyzer and ControllerHDI Instrumentation IPS-6000 / SRA-FA Hard Disk Surface Reflectance Analyzer and ControllerHDI Instrumentation IPS-6000 / SRA-FA Hard Disk Surface Reflectance Analyzer and Controller
HDI Instrumentation IPS-6000 / SRA-FA Hard Disk Surface Reflectance Analyzer and ControllerHDI Instrumentation IPS-6000 / SRA-FA Hard Disk Surface Reflectance Analyzer and ControllerHDI Instrumentation IPS-6000 / SRA-FA Hard Disk Surface Reflectance Analyzer and Controller
HDI Instrumentation IPS-6000 / SRA-FA Hard Disk Surface Reflectance Analyzer and ControllerHDI Instrumentation IPS-6000 / SRA-FA Hard Disk Surface Reflectance Analyzer and ControllerHDI Instrumentation IPS-6000 / SRA-FA Hard Disk Surface Reflectance Analyzer and Controller


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