JEM Wafer Probes
  • JEM_110_105_Multi_View1
  • JEM_110_105_Multi_View2
  • JEM_HP_YAQUINA2_View1
  • JEM_HP_YAQUINA2_View2

JEM Wafer Probes

Features

  • User Customizable
  • Modular
  • Many Configurations

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This JEM 110-105-Multi Wafer Probe Module is used and in excellent condition.

View Photo of this unit's wafer probe aperture

View Photo of this unit's wafer probe aperture, from the bottom

View Photo of the bottom of this unit





This JEM HP-YAQUINA2 Prototype Test Card is used and in excellent condition. This unit has some user-installed wiring that is easily removed.

This unit has a cracked rear connector. View Photo of rear connector.

View Photo of this unit's wafer probe aperture

View Photo of this unit's wafer probe aperture, from the bottom

View Photo of the bottom of this unit

Part Number: 010-02560-1




  • Description
  • Tech Specs
  • Datasheets / Manuals 
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Description

The JEM Wafer Probes are modular, user-customizable wafer probes. Many configurations are available.

Product Family: 110-105-Multi, HP YAQUINA2, 010-02560-1, 010025601, 010 02560
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Specifications

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Resources

Manuals, Datasheets, Drivers, Links

Link to JEM Website