Marvin Test Sets / Geotest GX5293 Dynamically Controlled High Speed Digital I/O PXI Card
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Marvin Test Sets / Geotest GX5293 Dynamically Controlled High Speed Digital I/O PXI Card



Configuration:
• (16) Channels Per Pin Control
• Frequency Range: 200 MHz (MAX)
• 256 MB Memory Depth Per Channel

Part Numbers: 235200, 235201




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Stock # 95357-2
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Marvin Test Sets / Geotest GX5290 Series Dynamically Controlled High Speed Digital I/O PXI Card

Features
  • 32 Input/Output Channels
  • Dynamically Configurable on a Per Channel Basis
  • 256 MB of On-Board Vector Memory
  • Supports TTL, LVTTL and LVDS Interfaces
  • Supports vector rates to 200 MHz

Description

The Marvin Test Sets / Geotest GX5290 Series High Speed Digital I/O PXI Cards are high performance, cost-effective 3U PXI dynamic digital I/O boards offering 32 digital input or output channels with dynamic direction control. The GX5290 Series also supports deep pattern memory by offering 256 MB of on-board vector memory with dynamic per pin direction control and with test rates up to 200 MHz. The single board design supports both master and slave functionality without the use of add-on modules.

The GX5290 Series supports selectable I/O levels of 1.5 V, 1.8 V, 2.5 V, or 3.3 V (TTL, LVTTL, CMOS, LVCMOS). In addition, the GX5290 Series support 32 differential channels for LVDS, M-LVDS, or LVDM logic families. The TTL / LVTTL interface utilizes a programmable voltage source, which sets the output logic levels from 1.4 V to 3.6 V. Programmable thresholds of 1.5 V, 1.8 V, 2.5 V or 3.3 V (5 V compatible) are supported for input signals. Recommended operating input voltage range is from 0 V to 5.5 V.

A windowing method is utilized for PCI memory accesses, which limits the required PCI memory space for each board to only 16 MB, thus preserving test system resources. A direct mode, for continuous data transfer between the test system controller and the I/O pins of the GX5290 Series are also supported.

The GX5290 Series offers 256 MB of vector memory, with 64 Mb per channel. Programmable I/O width allows trading vector width for vector depth. Under software control, the GX5290 Series's vector memory can be configured to support channel widths of 32, 16, 8, 4, 2 and 1 with corresponding vector depths of 64 Mb, 128 Mb, 256 Mb, 512 Mb, 1024 Mb, and 2048 Mb.


Product Family: GX5290, GX-5290, GX/5290, GX 5290, GX.5290, GX529O, GX5290-50, GX5290-100, GX5292, GX5293


Important Notice: Please note that any additional items included with this equipment such as accessories, manuals, cables, calibration data, software, etc. are specifically listed in the above stock item description and/or displayed in the photos of the equipment. Please contact one of our Customer Support Specialists if you have any questions about what is included with this equipment or if you require any additional information.


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Marvin Test Sets / Geotest GX5290 Series Dynamically Controlled High Speed Digital I/O PXI CardMarvin Test Sets / Geotest GX5290 Series Dynamically Controlled High Speed Digital I/O PXI CardMarvin Test Sets / Geotest GX5290 Series Dynamically Controlled High Speed Digital I/O PXI Card
Marvin Test Sets / Geotest GX5290 Series Dynamically Controlled High Speed Digital I/O PXI Card


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