IPS-6000 / SRA-FA HDI Instrumentation Hard Disk Surface Reflectance Analyzer and Controller

The HDI Instrumentation IPS-6000, coupled with the SRA-FA, allows for full Hard Disc surface analysis in a matter of seconds. The analysis process can detect carbon wear, roll off, wafer defects, waviness, and more within user set parameters across the entire surface of a substrate. To check for accuracy in the measurement process, the SRA-FA can scribe marks into a disk platter and the user can manually calibrate off the scribed markings. The SRA can handle most every kind of substrate material and is excellent for: detection, classification and mapping of residues, stains, pits, bumps, contamination and other types of defects left from a substrate cleaning process. Visually displays surface variation for most any type of coating material and deposition process, using simultaneous S, P, Phase, and Scattered light acquisition.

This HDI system is capable of optically scanning, in a matter of seconds, the entire surface of a substrate providing measurement data and visual images of a wide range of surface properties. The SRA can handle most every kind of substrate material and are excellent for: Detection, classification and mapping of residues, stains, pits, bumps, contamination and other types of defects left from a substrate cleaning process Detection, classification and mapping of residues, scratches and particles left from a substrate polishing process Measurement of the thickness and other characteristics of a deposited coating and visually displaying coating uniformity variations, for most any type of coating material and deposition process Detection and measurement of surface smoothness/waviness and variations Inspection and detection of surface tribology performance problems and issues HDI instruments are widely used in Research and Development, failure analysis, incoming inspection and manufacturing process control.


• Multi-channel, full surface scans in less than 10 seconds
• Patented temperature stabilized laser technology
• Sub-Angstrom sensitivity to overcoat and lubricant variations
• 0.1 micron x 0.003 degree precision
• 3.2 micron resolution
• Airbearing spindle with integrated vacuum clamp for fast load/unload of disks
• Macro programming
• Pushbutton operation with auto-analysis
• Automated system calibration
• Extensive 16-Bit image display and analysis package with v
• X-Y data display (ring format) and R-theta data display (flat format)
• 1d and 2d histogram and Fourier analysis of data
• Image math, filtering, and flattening
• Linegraphs, track and angular averaged data expressed in % reflectivity or Angstrom
• Text and bitmap output options


• Overcoat thickness and optical properties
• Substrate brightness and optical properties
• Fourier and statistical uniformity analysis
• Defect, stain, and handling damage detection