1020 E. A. Fischione Plasma Cleaner

The E. A. Fischione Model 1020 Plasma Cleaner automatically and quickly removes organic contamination (hydrocarbon) from electron microscopy (EM) specimens and specimen holders. A low energy, reactive gas plasma cleans without changing the specimen’s elemental composition or structural characteristics. The Model 1020 features easy-to-use front panel controls and an oil-free vacuum system for optimal processing.

Cleaning is solely by reactive gas compounds formed by the plasma chemically reacting with carbonaceous material on the specimen and specimen holder. The nonequilibrium, high frequency plasma is generated with a gas mixture of 25% oxygen and 75% argon. Free electrons are accelerated to high velocities by an oscillating electromagnetic field (13.56 MHz) that excites gas atoms and creates the plasma. The plasma ions impinge upon the surface with energies of less than 12eV, which is below the specimen’s sputtering threshold.In electron microscopes with high brightness electron sources, specimens that are not plasma treated tend to contaminate. The Model 1020 Plasma Cleaner ensures confidence that carbonaceous contamination will not interfere with imaging or analysis, even during fine probe microanalysis for extended periods.