HFS 9DG1 Tektronix Data Time Generator Module

The Tektronix HFS 9000 Stimulus System combines the capabilities of a complete data generator, pulse generator, and switch matrix in a single instrument. Together with a high-speed digitizing oscilloscope, the HFS 9000 provides a complete device characterization and test solution with unsurpassed accuracy and repeatability. Some of the outstanding characteristics of the HFS 9000 are as follows:

• Multi-channel stimulus — The HFS 9000 can be configured with up to 36 channels of output in one mainframe, and up to 640 channels across multiple phase-locked systems.

• Independent edge placement — This feature can be applied to all channels and is especially useful in characterizing synchronous components.

• Up to 1 ps timing resolution — The timing resolution is an order of magnitude greater than typical ECL gate delays. Combined with the multi-channel capability, this allows for setup and hold time margin testing by providing clock, data, set, and reset signals to the device under test.

• Advanced trigger features — The triggering is designed specifically to help in device characterization. Phase lock lets you synchronize the HFS 9000 to other signal sources. Trigger out deskew eliminates the timing delays introduced by cabling.

• Mixed logic family testing — The HFS 9000 can be configured to combine different kinds of pulse output in the same mainframe for characterizing mixed-logic components.

• Exceptionally flexible formatting — A high-speed card can provide data at a rate of up to 630 MB/sec, with a transition time of less than 250 ps. A variable rate card has a variable transition time between 800 ps to 6 ns.

• Fully programmable digital architecture — The HFS 9000 is a digital instrument throughout. This means that the HFS 9000 can be fully programmed through either the GPIB or RS-232-C interface. Programmed control is essential for automated, repeatable tests. In addition, the program capability of the HFS 9000 means that it will fit easily into your automated test system. A complete automated test facility can be configured from an HFS 9000, a controller such as a PC, and a high-speed acquisition system such as the Tektronix 11801B Digital Sampling Oscilloscope.

• Graphic display — Sample waveforms show how the controls are set, and indicate visually the parameter that a particular control governs.