8460233 Accent Optical Technologies Circuit Board

The Nanometrics / Accent Optical Technologies DiVA Series Dynamic I(V) Analyzer provides pulsed or dynamic I(V) analysis which can give direct access to characterization data unavailable from other methods. Is dynamic I(V) new? No - the science behind using pulsed measurements for better device characterization has been understood for some time, but until recently the benefits of this method have been restricted to the few organizations that could afford a large commercial system or had the expertise to build their own. DiVA has changed that paradigm. For the first time facilities that can cost several $100k with footprints measured in square yards can now be found in a compact single box solution that costs far less. And, DiVA’s tight integration of leading-edge technology and unique intellectual property gives accurate measurements in a fraction of the times achieved by previous systems.

The name DiVA has its roots in the phrase Dynamic I(V) Analyzer. Many will be familiar with the concept of I(V) Analysis, so what about "Dynamic"? DC I(V) measurements can be referred to as steady state or Static because all time dependent phenomena in a device have had a chance to reach equilibrium before a measurement is made. Pulsed I(V) can therefore be thought of as Dynamic by the same reasoning. Measurements taken using a sufficiently fast pulse are free of phenomena such as self-heating and changes in stored charge (traps). This is critically important when considering the behavior of a device to fast moving control voltages, such as those present in RF and other high frequency signals.