80E03 Tektronix Dual-Channel 20GHz Sampling Module

The Tektronix 80E10B, 80E08B, and 80E04 Electrical Sampling Modules are dual-channel Time Domain Reflectometry (TDR) sampling modules, providing up to 12 ps incident and 15 ps reflected rise time in the 80E10B (18 ps incident in 80E08B and 23 ps incident i n 80E04). Each channel of these modules is capable of generating a fast step for use in TDR mode and the acquisition portion of the sampling module monitors the incident step and any reflected energy. The polarity of each channel's step can be selected independently. This allows for differential or common mode TDR or S-parameter testing of two coupled lines, in addition to the independent testing of isolated lines. The independent step generation for each channel allows true differential measurements, which ensures measurement accuracy for differential devices.

The 80E10B and 80E08B are small form factor, fully integrated independent 2-meter remote sampler systems, enabling location of the sampler near the DUT and ensuring the best signal fidelity. The modules characterize crosstalk by using TDR steps to drive one line (or line pair for differential crosstalk) while monitoring a second line (or line pair) with the other channel (or another module for differential crosstalk). The "filter" function on the 8000 series mainframes can be used with TDR or crosstalk measurements to characterize expected system performance with slower edge rates.

All modules have independent incident step and receiver deskew to remove the effect of measurement fixtures and probes, enabling faster and easier de-embedding of test fixtures. The 80E10B sampling modules provide an acquisition rise time of 7 ps, with up to 50 GHz user-selectable equivalent bandwidth (with 50, 40, and 30 GHz settings). The 80E08B sampling bandwidth is 30 GHz (user selectable with 30 and 20 GHz settings) and 80E04 sampling bandwidth is 20 GHz. The 20 GHz P8018 single-ended and 18 GHz P80318 differential variable pitch TDR probes provide excellent performance and compliance, ensuring easy and accurate backplane and package measurements.

When the user employs these modules with Tektronix IConnect TDR and VNA software, he or she can acquire up to 1,000,000 data points and obtain up to 50 GHz differential, mixed mode, and single-ended S-parameters. IConnect also enables impedance, S-parameters, and eye-diagram compliance testing as required by various serial data standards, as well as full channel analysis, Touchstone (SnP) fi le output, and SPICE modeling for gigabit interconnects.

The Tektronic 80E09B and 80E07B Electrical Sampling Modules are dual-channel modules with remote samplers, capable of 450 µ V RMS noise at 60 GHz sampling bandwidth, and 300 µ V at 30 GHz sampling bandwidth. Each small form factor remote sampler is attached to a 2-meter cable in order to minimize the effects of cables, probes, and fixtures, allow close location of the sampler to the DUT, and ensure best signal fidelity. User-selectable bandwidth settings (60/40/30 on 80E09B and 30/20 on 80E07B) offer optimal noise/bandwidth trade-off.

The Tektronic 80E11 and 80E11X1 Electrical Sampling Modules are dual and single channel, 70+ GHz bandwidth sampling modules. These modules provide the widest measurement bandwidth and fastest rise time measurements with world class signal fidelity. User-selectable bandwidth settings (70/60/40 GHz) enable optimal noise/bandwidth trade-off.

The Tektronic 80E01 Electrical Sampling Module is a single-channel, 50 GHz bandwidth sampling module. The 80E11, 80E11X1, and 80E01 modules can be used with the optional 2-meter extender cable, which ensures superior signal fidelity and measurement flexibility.

The Tektronic 80E03 and 80E03-NV Electrical Sampling Modules are dual-channel, 20 GHz sampling modules. These sampling modules provide an acquisition rise time of 17.5 ps or less.

When used with Tektronix 80SJNB Jitter, Noise, and BER software, these modules enable separation of both jitter and noise into their components, understanding precise causes of eye closure, and obtaining highly accurate extrapolation of BER and 3-D eye contour. When used with the 82A04B phase reference module, time-base accuracy can be improved down to <100 fs RMS jitter, which together with the 300 µ V noise floor and 16 bits of resolution ensures the highest signal fidelity for the measured signals.