Features:
- Variety of Connector Types
- Multiple Rackmount Options
- Automatic Routing and Conditioning of Signals
The Keysight N8990 Series Rackmount Switch Matrices are rackmount boxes with size, weight, connector type, and location designed to fit a variety of specifications. Options include LED readouts, external switch drivers, system interface, and alarm circuits.
The N8990C-R32 Keysight Monitor Interface Drawer may still be available for purchase and support from Artisan Technology Group beyond End-Of-Life (EOL) by the manufacturer (OEM).
Functions
Provides centralized monitoring and control interface for test and measurement systems through rack-mounted drawer configuration. Integrates multiple instrument displays and control panels into unified workspace with customizable screen layouts for real-time parameter monitoring, system status visualization, and remote instrument operation. Enables consolidated access to networked test equipment via LAN/GPIB interfaces, supporting multi-instrument synchronization and coordinated measurements. Features touch-enabled displays with configurable dashboards for automated test executive integration, alarm management, and measurement result aggregation. Facilitates operator interaction through ergonomic pull-out drawer design optimized for production test environments and laboratory benchtop applications.
Platforms
The N8990C-R32 is a rack-mountable monitor interface drawer. It's designed to house a monitor, keyboard, and mouse, offering a consolidated user interface. The drawer integrates with the rack-mounted equipment via standard video (VGA, DVI), keyboard/mouse (USB or PS/2), and power connections. It is typically used in conjunction with other rack-mounted test and measurement equipment, providing a centralized control point for system operation and monitoring.
Applications
Specialized hardware interface drawer designed for monitor connection and signal distribution in electronic test and measurement environments. Facilitates efficient signal routing between test instruments and display devices. Supports multiple monitor interfaces with integrated routing capabilities, providing centralized control of display outputs in automated test systems. Enables enhanced visualization of measurement data through synchronized multi-display configurations. Commonly deployed in RF testing, signal integrity analysis, and production test environments where multiple measurement displays must be managed simultaneously.
Accessories
Requires compatible N8900 series ATE mainframe or system chassis for operation. Connects via proprietary backplane interface with multi-pin high-density connector. Features front panel BNC connectors for monitor signal input/output, DB-9 serial interface connector for external communication, and internal ribbon cable connections to backplane. May require specific interface cards or modules depending on system configuration. Power supplied through backplane connection, no external power adapter needed.
Interfaces
Requires N8900 series mainframe chassis for operation. Features 32-channel monitoring capability with dedicated input connectors for voltage and current sensing. Equipped with RJ-45 Ethernet port for remote monitoring and control. Includes multiple BNC connectors for analog signal outputs. USB Type-A connector for local data logging and configuration. Internal backplane connection via proprietary multi-pin connector to mainframe power supply modules. Digital I/O interface with 15-pin D-sub connector for external control signals. Front panel LCD display with navigation buttons for local status monitoring.
Specifications
Rack-mountable interface drawer provides remote monitoring and control of power systems. It features a 3.2-inch LCD for local display of voltage, current, and power readings. Connectivity includes LAN, USB, and GPIB for automated system integration and data acquisition. It enables real-time system status monitoring and control via a standard web browser or instrument control software. Primarily used in ATE systems, research and development, and manufacturing test environments.
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