A310 Rohde & Schwarz Graphics Card for ZVM Vector Network Analyzer
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Item details
| Part Number | A310 |
|---|---|
| In Stock | 3 |
| Available | Today |
| Location | Champaign, IL USAships worldwide |
| Stock # | 95403-10 |
| Ship Weight | 6 lbs /ea |
| Condition | Used and in Excellent Condition |
| Inspection | Before every shipment |
| Warranty | 1-Year Warranty with 30-Day Return Guarantee |
Description
Configuration:
• Memory:
• 2 MB CMOS SGRAM
• 4 MB DRAM
Part Number: 1043.4610.00
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Rohde & Schwarz A310 Graphics Card for ZVM Vector Network Analyzer Overview
Features:
- Excellent Dynamic Range
- Low Inherent Noise
- High Measurement Speed
- Fast Data Transfer via IEC/IEEE Bus
- Easy Integration Into PC Environment and Networks
The ZVM and ZVK have two independent synthesizers for the generator and the receiver. In the receiver sections, fundamental mixing is used up to high frequencies to provide the excellent dynamic range and outstanding selectivity, enabling straightforward measurements on frequency-converting DUTs or DUTs with extremely high selectivity.
The ZVM and ZVK feature modern calibration techniques patented by Rohde & Schwarz that allow full two-port calibration using fewer or only partially known standards. This simplifies the design of calibration standards used for example in test fixtures or on wafers. Thus calibration in non-coaxial systems can be performed with a minimum of effort at maximum accuracy and dynamic range.
The Virtual Embedding Networks option enables virtual embedding of arbitrary linear two-port networks into the test setup. The required data are obtained from a measurement of the existing network or generated by CAE tools from the theoretical model.
In tests of components that have to be matched to a given impedance, the matching network can thus be taken into account through mathematical algorithms of ZVM and ZVK instead of using the physical network. This method guarantees high accuracy, ideal reproducibility and maximum reliability without any loss of speed - great advantages especially in production.
Conversely, by de-embedding, the influence of a known network can be eliminated. The S-parameters of a chip can be analyzed, compensating for the effects of its housing and bonding leads through de-embedding.
By transforming measurement data from the frequency to the time domain, discontinuities or impedances along the DUT can be displayed as a function of DUT length. With a maximum number of 2001 points, ZVM and ZVK can measure even very long DUTs with high resolution. Five filters allow the location of a discontinuity and the sidelobe suppression to be determined with optimum resolution. The S-parameters of a given discontinuity can be displayed in the time domain by setting a window (gating). An additional processor module included in the corresponding option accelerates data processing and the display of results to provide even realtime display - a valuable aid, for example in the tuning of bandpass filters with time domain transformation.
ZVM and ZVK are based on Windows NT. The user has complete access to the hard disk, the floppy disk drive and all interfaces of the internal PC. This allows, for example, the connection of an external monitor, the installation of any type of printer, or the use of software tools on ZVM or ZVK for result processing or control of the network analyzers via the IEC/ IEEE bus or an internal RSIB*) data bus. ZVM and ZVK can thus act as controllers of their own or for a complete test or production system. Moreover, the internal PC enables control and data exchange via Ethernet.
In the decoupled mode, the frequency grid, measurement bandwidth, calibration technique and measurement mode can be configured independently for each of the four display channels. In amplifier measurements, this allows the simultaneous measurement and display of important parameters in quasi-realtime, such as gain, compression point (power sweep) and harmonics versus power or frequency, or compression point versus frequency.
The Rohde&Schwarz two-port calibration techniques reduce the number of required calibration standards to a minimum of 2. This significantly cuts the time required for manual calibration. The short measurement time of <500 µs or <700 µs per point guarantees minimum sweep times through to realtime display. The output of a marker value via the IEC/IEEE bus takes less than 5 ms, the transfer of a complete trace (200 points) less than 15 ms. These features are the basis for the excellent performance of ZVM and ZVK both in manual operation and in automated test systems.
The Rohde & Schwarz A310 Graphics Card for ZVM Vector Network Analyzer may still be available for purchase and support from Artisan Technology Group beyond End-Of-Life (EOL) by the manufacturer (OEM).
Graphics Card for ZVM Vector Network Analyzer Price & Specs
Rohde & Schwarz A310 Graphics Card for ZVM Vector Network Analyzer Description
Functions
A dedicated graphics processing unit designed to render complex vector network analyzer measurement data, including Smith charts, polar diagrams, and S-parameter traces. It provides video output for the instrument's integrated display and an external monitor, typically via a DVI interface. The unit offloads graphics rendering from the VNA's main controller CPU, enhancing user interface responsiveness and measurement visualization performance.
Platforms
Graphics processing and display interface card engineered for vector network analyzer instrumentation systems. Operates within Rohde & Schwarz ZVM analyzer mainframe architecture utilizing proprietary internal bus communication protocols. Interfaces through dedicated graphics expansion slots with analyzer motherboard via high-speed data buses for real-time measurement visualization. Processes complex vector measurement data including S-parameters, Smith charts, and frequency domain displays with specialized graphics acceleration optimized for RF measurement applications. Connects to external VGA/DVI monitor outputs and internal display systems. Supports multi-trace plotting, marker functions, and calibration graphics rendering essential for RF component characterization, antenna testing, filter analysis, and network parameter measurements in laboratory and production environments.
Applications
Enables high-resolution graphical display of complex S-parameter measurements, including magnitude, phase, Smith chart, and group delay, for comprehensive RF/microwave component characterization. Facilitates detailed analysis of impedance matching, filter responses, amplifier gain/stability, and material properties. Supports multi-monitor configurations for enhanced data visualization during R&D, production test, and signal integrity assessment, aiding engineers in precise interpretation of intricate vector network analysis results.
Accessories
Requires ZVM Vector Network Analyzer mainframe for installation. PCIe x16 connector interface for graphics processing. VGA D-Sub 15-pin female connector for external monitor connection. DVI-D 24+1 pin digital video interface. DisplayPort 20-pin connector for high-resolution displays. Cooling fan assembly and heat sink for thermal management. Driver software installation media. Compatible with ZVM40, ZVM50, and ZVM60 analyzer models.
Interfaces
DB15 female VGA output connector for external monitor display, proprietary 96-pin DIN connector for direct connection to ZVM mainframe backplane bus, requires ZVM mainframe chassis for operation, compatible with slots 2-8 in ZVM mainframe, draws power directly from mainframe backplane 5V and 12V rails, supports 1024x768 resolution at 60Hz refresh rate, includes 4MB VRAM, passive cooling design with heat dissipation through mainframe ventilation system
Specifications
High-performance graphics processing card designed to accelerate display rendering and visualization capabilities for vector network analyzer systems. Operates within PCI-based measurement instrument platforms, providing dedicated GPU processing for complex S-parameter plots, Smith charts, and multi-trace displays. Interfaces through standard PCI Express slots with direct memory access to measurement data buffers. Supports real-time waveform rendering, zoom operations, and multi-window display configurations. Enables high-resolution graphical output to external monitors via VGA/DVI connections. Applications include RF component characterization, antenna testing, and high-frequency circuit analysis where rapid visual feedback of measurement results is critical.
This section includes content generated with the assistance of artificial intelligence (AI) tools. AI is used to increase efficiency and provide timely information. Please note that the content may not have been reviewed for accuracy or completeness. Use this information at your own discretion, and verify details independently as needed.
Rohde & Schwarz A310 Graphics Card for ZVM Vector Network Analyzer Manuals, Datasheets, Drivers, Links
Rohde & Schwarz A310 Graphics Card for ZVM Vector Network Analyzer Specs
| General | |
|---|---|
| Manufacturer | Rohde & Schwarz |
| Model | A310 |
| Condition | Used and in Excellent Condition |
| Product Family | ZVM, ZVK |
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Important Notice: Other accessories, manuals, cables, calibration data, software, etc. are not included with this equipment unless listed in the above stock item description. All prices are shown in USD.
Artisan Scientific Corporation dba Artisan Technology Group is not affiliated with or a distributor for Rohde & Schwarz. The depiction, description, or sale of products featuring names, trademarks, brands, and logos is for identification and/or reference purposes only and does not indicate any affiliation with or authorization by any rights holder.
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