Features:
- Excellent Dynamic Range
- Low Inherent Noise
- High Measurement Speed
- Fast Data Transfer via IEC/IEEE Bus
- Easy Integration Into PC Environment and Networks
The Rohde & Schwarz ZVM/ZVK Vector Network Analyzers are compact instruments
with integrated generator, two reference
and two receiver channels and a bidirectional test set. This can be extended by
attenuators with integrated switches in
the generator and receiver paths. With
this configuration, ZVM and ZVK offer
direct access to all reference and receiver
channels. This concept makes ZVM and
ZVK well equipped for complex test setups, for example for bidirectional measurements on power amplifiers.
The ZVM and ZVK have two independent synthesizers for the generator and the
receiver. In the receiver sections, fundamental mixing is used up to high frequencies to provide the excellent dynamic
range and outstanding selectivity,
enabling straightforward measurements
on frequency-converting DUTs or DUTs
with extremely high selectivity.
The ZVM and ZVK feature modern calibration
techniques patented by Rohde & Schwarz
that allow full two-port calibration using
fewer or only partially known standards.
This simplifies the design of calibration
standards used for example in test
fixtures or on wafers. Thus calibration in
non-coaxial systems can be performed
with a minimum of effort at maximum
accuracy and dynamic range.
The Virtual Embedding Networks option
enables virtual embedding of arbitrary
linear two-port networks into the test
setup. The required data are obtained from a measurement of the existing network or generated by CAE tools from the theoretical
model.
In tests of components that have to be
matched to a given impedance, the
matching network can thus be taken into
account through mathematical algorithms of ZVM and ZVK instead of using
the physical network. This method guarantees high accuracy, ideal reproducibility and maximum reliability without any
loss of speed - great advantages especially in production.
Conversely, by de-embedding, the influence of a known network can be eliminated. The S-parameters of a chip can be
analyzed, compensating for the effects of
its housing and bonding leads through
de-embedding.
By transforming measurement data from
the frequency to the time domain, discontinuities or impedances along the DUT
can be displayed as a function of DUT
length. With a maximum number of 2001
points, ZVM and ZVK can measure even
very long DUTs with high resolution. Five
filters allow the location of a discontinuity
and the sidelobe suppression to be determined with optimum resolution. The
S-parameters of a given discontinuity can
be displayed in the time domain by setting a window (gating). An additional
processor module included in the corresponding option accelerates data processing and the display of results to
provide even realtime display - a valuable
aid, for example in the tuning of bandpass filters with time domain transformation.
ZVM and ZVK are based on Windows NT.
The user has complete access to the hard
disk, the floppy disk drive and all interfaces of the internal PC. This allows, for
example, the connection of an external
monitor, the installation of any type of
printer, or the use of software tools on
ZVM or ZVK for result processing or control of the network analyzers via the IEC/
IEEE bus or an internal RSIB*) data bus.
ZVM and ZVK can thus act as controllers
of their own or for a complete test or production system. Moreover, the internal
PC enables control and data exchange
via Ethernet.
In the decoupled mode, the frequency
grid, measurement bandwidth, calibration technique and measurement mode
can be configured independently for each
of the four display channels. In amplifier
measurements, this allows the simultaneous measurement and display of
important parameters in quasi-realtime,
such as gain, compression point (power sweep) and harmonics versus power or
frequency, or compression point versus
frequency.
The Rohde&Schwarz two-port calibration
techniques reduce the number of required calibration standards to a minimum of 2.
This significantly cuts the time required for
manual calibration. The short measurement time of <500 µs or <700 µs per
point guarantees minimum sweep times
through to realtime display. The output of
a marker value via the IEC/IEEE bus takes less than 5 ms, the transfer of a complete
trace (200 points) less than 15 ms. These
features are the basis for the excellent performance of ZVM and ZVK both in manual
operation and in automated test systems.
The 1066.2543 Rohde & Schwarz Ethernet Interface Board for ZVM Vector Network Analyzer may still be available for purchase and support from Artisan Technology Group beyond End-Of-Life (EOL) by the manufacturer (OEM).
Functions
Ethernet interface board providing 10/100 Mbps network connectivity for vector network analyzers through RJ-45 connector.
Platforms
Integrates with ZVM Vector Network Analyzer, providing Ethernet connectivity for remote control and data transfer. Compatible with systems leveraging LAN communication protocols, supporting interface via Ethernet-based networks.
Applications
Provides Ethernet connectivity to a ZVM Vector Network Analyzer for remote control, data transfer, and network integration. hardware: Designed for integration into the ZVM Vector Network Analyzer mainframe. Connects to the ZVM's internal bus and provides an external RJ45 Ethernet port for connection to a local area network.
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