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A10 Rohde & Schwarz Motherboard for ZV Series Vector Network Analyzer
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Item details
| Part Number | A10 |
|---|---|
| In Stock | 5 |
| Available | Today |
| Location | Champaign, IL USAships worldwide |
| Stock # | 95403-9 |
| Ship Weight | 1 lbs /ea |
| Condition | Used and in Excellent Condition |
| Inspection | Before every shipment |
| Warranty | 1-Year Warranty with 30-Day Return Guarantee |
Description
Part Number: 1127.8900.02
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Rohde & Schwarz A10 Motherboard for ZV Series Vector Network Analyzer Overview
Features:
- Excellent Dynamic Range
- Low Inherent Noise
- High Measurement Speed
- Fast Data Transfer via IEC/IEEE Bus
- Easy Integration Into PC Environment and Networks
The Rohde & Schwarz ZVM/ZVK Vector Network Analyzers are compact instruments
with integrated generator, two reference
and two receiver channels and a bidirectional test set. This can be extended by
attenuators with integrated switches in
the generator and receiver paths. With
this configuration, ZVM and ZVK offer
direct access to all reference and receiver
channels. This concept makes ZVM and
ZVK well equipped for complex test setups, for example for bidirectional measurements on power amplifiers.
The ZVM and ZVK have two independent synthesizers for the generator and the receiver. In the receiver sections, fundamental mixing is used up to high frequencies to provide the excellent dynamic range and outstanding selectivity, enabling straightforward measurements on frequency-converting DUTs or DUTs with extremely high selectivity.
The ZVM and ZVK feature modern calibration techniques patented by Rohde & Schwarz that allow full two-port calibration using fewer or only partially known standards. This simplifies the design of calibration standards used for example in test fixtures or on wafers. Thus calibration in non-coaxial systems can be performed with a minimum of effort at maximum accuracy and dynamic range.
The Virtual Embedding Networks option enables virtual embedding of arbitrary linear two-port networks into the test setup. The required data are obtained from a measurement of the existing network or generated by CAE tools from the theoretical model.
In tests of components that have to be matched to a given impedance, the matching network can thus be taken into account through mathematical algorithms of ZVM and ZVK instead of using the physical network. This method guarantees high accuracy, ideal reproducibility and maximum reliability without any loss of speed - great advantages especially in production.
Conversely, by de-embedding, the influence of a known network can be eliminated. The S-parameters of a chip can be analyzed, compensating for the effects of its housing and bonding leads through de-embedding.
By transforming measurement data from the frequency to the time domain, discontinuities or impedances along the DUT can be displayed as a function of DUT length. With a maximum number of 2001 points, ZVM and ZVK can measure even very long DUTs with high resolution. Five filters allow the location of a discontinuity and the sidelobe suppression to be determined with optimum resolution. The S-parameters of a given discontinuity can be displayed in the time domain by setting a window (gating). An additional processor module included in the corresponding option accelerates data processing and the display of results to provide even realtime display - a valuable aid, for example in the tuning of bandpass filters with time domain transformation.
ZVM and ZVK are based on Windows NT. The user has complete access to the hard disk, the floppy disk drive and all interfaces of the internal PC. This allows, for example, the connection of an external monitor, the installation of any type of printer, or the use of software tools on ZVM or ZVK for result processing or control of the network analyzers via the IEC/ IEEE bus or an internal RSIB*) data bus. ZVM and ZVK can thus act as controllers of their own or for a complete test or production system. Moreover, the internal PC enables control and data exchange via Ethernet.
In the decoupled mode, the frequency grid, measurement bandwidth, calibration technique and measurement mode can be configured independently for each of the four display channels. In amplifier measurements, this allows the simultaneous measurement and display of important parameters in quasi-realtime, such as gain, compression point (power sweep) and harmonics versus power or frequency, or compression point versus frequency.
The Rohde&Schwarz two-port calibration techniques reduce the number of required calibration standards to a minimum of 2. This significantly cuts the time required for manual calibration. The short measurement time of <500 µs or <700 µs per point guarantees minimum sweep times through to realtime display. The output of a marker value via the IEC/IEEE bus takes less than 5 ms, the transfer of a complete trace (200 points) less than 15 ms. These features are the basis for the excellent performance of ZVM and ZVK both in manual operation and in automated test systems.
The ZVM and ZVK have two independent synthesizers for the generator and the receiver. In the receiver sections, fundamental mixing is used up to high frequencies to provide the excellent dynamic range and outstanding selectivity, enabling straightforward measurements on frequency-converting DUTs or DUTs with extremely high selectivity.
The ZVM and ZVK feature modern calibration techniques patented by Rohde & Schwarz that allow full two-port calibration using fewer or only partially known standards. This simplifies the design of calibration standards used for example in test fixtures or on wafers. Thus calibration in non-coaxial systems can be performed with a minimum of effort at maximum accuracy and dynamic range.
The Virtual Embedding Networks option enables virtual embedding of arbitrary linear two-port networks into the test setup. The required data are obtained from a measurement of the existing network or generated by CAE tools from the theoretical model.
In tests of components that have to be matched to a given impedance, the matching network can thus be taken into account through mathematical algorithms of ZVM and ZVK instead of using the physical network. This method guarantees high accuracy, ideal reproducibility and maximum reliability without any loss of speed - great advantages especially in production.
Conversely, by de-embedding, the influence of a known network can be eliminated. The S-parameters of a chip can be analyzed, compensating for the effects of its housing and bonding leads through de-embedding.
By transforming measurement data from the frequency to the time domain, discontinuities or impedances along the DUT can be displayed as a function of DUT length. With a maximum number of 2001 points, ZVM and ZVK can measure even very long DUTs with high resolution. Five filters allow the location of a discontinuity and the sidelobe suppression to be determined with optimum resolution. The S-parameters of a given discontinuity can be displayed in the time domain by setting a window (gating). An additional processor module included in the corresponding option accelerates data processing and the display of results to provide even realtime display - a valuable aid, for example in the tuning of bandpass filters with time domain transformation.
ZVM and ZVK are based on Windows NT. The user has complete access to the hard disk, the floppy disk drive and all interfaces of the internal PC. This allows, for example, the connection of an external monitor, the installation of any type of printer, or the use of software tools on ZVM or ZVK for result processing or control of the network analyzers via the IEC/ IEEE bus or an internal RSIB*) data bus. ZVM and ZVK can thus act as controllers of their own or for a complete test or production system. Moreover, the internal PC enables control and data exchange via Ethernet.
In the decoupled mode, the frequency grid, measurement bandwidth, calibration technique and measurement mode can be configured independently for each of the four display channels. In amplifier measurements, this allows the simultaneous measurement and display of important parameters in quasi-realtime, such as gain, compression point (power sweep) and harmonics versus power or frequency, or compression point versus frequency.
The Rohde&Schwarz two-port calibration techniques reduce the number of required calibration standards to a minimum of 2. This significantly cuts the time required for manual calibration. The short measurement time of <500 µs or <700 µs per point guarantees minimum sweep times through to realtime display. The output of a marker value via the IEC/IEEE bus takes less than 5 ms, the transfer of a complete trace (200 points) less than 15 ms. These features are the basis for the excellent performance of ZVM and ZVK both in manual operation and in automated test systems.
The Rohde & Schwarz A10 Motherboard for ZV Series Vector Network Analyzer may still be available for purchase and support from Artisan Technology Group beyond End-Of-Life (EOL) by the manufacturer (OEM).
Motherboard for ZV Series Vector Network Analyzer Price & Specs
Rohde & Schwarz A10 Motherboard for ZV Series Vector Network Analyzer Description
Functions
Provides core processing and control functionality for vector network analyzer operations including RF signal generation, measurement data acquisition, digital signal processing, and system timing coordination. Interfaces with RF front-end modules, display controllers, and measurement accessories through high-speed data buses. Manages calibration routines, error correction algorithms, and measurement parameter settings. Supports frequency domain analysis, S-parameter measurements, and complex impedance calculations across specified frequency ranges.
Platforms
Motherboard designed for integration in vector network analyzer systems, providing computational backbone and I/O connectivity for RF measurement operations. Supports signal processing, calibration routines, and measurement algorithms specific to vector network analysis. Interfaces with RF front-end components, display systems, and peripheral devices. Enables accurate S-parameter measurements, impedance characterization, and network analysis across multiple frequency ranges. Delivers necessary processing power for complex mathematical operations required in RF characterization and device testing.
Applications
Designed as the central electronic processing and control unit within vector network analyzers, this motherboard facilitates signal generation, data acquisition, and processing functions. It integrates with RF frontends and display modules, managing key hardware and software interfaces essential for VNA operation. Commonly used in precision RF and microwave testing environments, it supports tasks such as S-parameter measurement, frequency response analysis, and network characterization across broad frequency ranges. It interfaces with other analyzer boards, power supplies, and operator controls to enable comprehensive network analysis and calibration procedures.
Accessories
Requires ZVM Vector Network Analyzer mainframe chassis for installation. Compatible with ZVM-B1 to ZVM-B4 frequency converter modules depending on frequency range requirements. Connects via proprietary backplane interface with 168-pin high-density connector. Supports external 10 MHz reference input via SMA connector. Ethernet interface through RJ45 connector for remote control. USB 2.0 Type-A ports for data transfer and peripheral connection. GPIB IEEE-488.2 interface via 24-pin standard connector for instrument control and data communication.
Interfaces
Two ZVM-B4 interface slots for IF and generator modules, system bus connector for data communication with measurement modules, power supply connector accepting +5V, +12V, -12V rails, VME-style 96-pin DIN 41612 backplane connector for chassis integration, I/O expansion header with 40-pin IDC connector, dedicated RF module interface with coaxial SMB connectors, control interface for front panel display module via 26-pin ribbon cable connector, GPIB controller interface, internal debugging port with 10-pin JTAG header
Specifications
A10 motherboard serves as the main processing platform for vector network analyzer systems, providing CPU processing capabilities, memory management, and system control functions. Features integrated circuits for signal processing, data acquisition, and measurement computation algorithms. Includes multiple interface connectors for RF measurement modules, display controllers, and external communication ports. Supports high-speed data transfer between measurement hardware and analysis software. Designed for precision RF and microwave measurement applications requiring stable timing references and low-noise operation in laboratory and production test environments.
This section includes content generated with the assistance of artificial intelligence (AI) tools. AI is used to increase efficiency and provide timely information. Please note that the content may not have been reviewed for accuracy or completeness. Use this information at your own discretion, and verify details independently as needed.
Rohde & Schwarz A10 Motherboard for ZV Series Vector Network Analyzer Manuals, Datasheets, Drivers, Links
Rohde & Schwarz A10 Motherboard for ZV Series Vector Network Analyzer Specs
| General | |
|---|---|
| Manufacturer | Rohde & Schwarz |
| Model | A10 |
| Condition | Used and in Excellent Condition |
| Product Family | ZVM, ZVK |
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Important Notice: Other accessories, manuals, cables, calibration data, software, etc. are not included with this equipment unless listed in the above stock item description. All prices are shown in USD.
Artisan Scientific Corporation dba Artisan Technology Group is not affiliated with or a distributor for Rohde & Schwarz. The depiction, description, or sale of products featuring names, trademarks, brands, and logos is for identification and/or reference purposes only and does not indicate any affiliation with or authorization by any rights holder.
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