Stock #50737-10
$695.00USD
52 In StockUsed and in Excellent Condition
1046.5001.05 Rohde & Schwarz 73 dB ZVM Step Attenuator
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Item details
| Part Number | 1046.5001.05 |
|---|---|
| In Stock | 12 |
| Available | Today |
| Location | Champaign, IL USAships worldwide |
| Stock # | 95403-5 |
| Ship Weight | 2 lbs /ea |
| Condition | Used and in Excellent Condition |
| Inspection | Before every shipment |
| Warranty | 1-Year Warranty with 30-Day Return Guarantee |
Description
Configuration:
• Frequency Range: DC-21 GHz
Part Number: 1046.5001.05
• Frequency Range: DC-21 GHz
Part Number: 1046.5001.05
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Rohde & Schwarz 1046.5001.05 73 dB ZVM Step Attenuator Overview
Features:
- Excellent Dynamic Range
- Low Inherent Noise
- High Measurement Speed
- Fast Data Transfer via IEC/IEEE Bus
- Easy Integration Into PC Environment and Networks
The Rohde & Schwarz ZVM/ZVK Vector Network Analyzers are compact instruments
with integrated generator, two reference
and two receiver channels and a bidirectional test set. This can be extended by
attenuators with integrated switches in
the generator and receiver paths. With
this configuration, ZVM and ZVK offer
direct access to all reference and receiver
channels. This concept makes ZVM and
ZVK well equipped for complex test setups, for example for bidirectional measurements on power amplifiers.
The ZVM and ZVK have two independent synthesizers for the generator and the receiver. In the receiver sections, fundamental mixing is used up to high frequencies to provide the excellent dynamic range and outstanding selectivity, enabling straightforward measurements on frequency-converting DUTs or DUTs with extremely high selectivity.
The ZVM and ZVK feature modern calibration techniques patented by Rohde & Schwarz that allow full two-port calibration using fewer or only partially known standards. This simplifies the design of calibration standards used for example in test fixtures or on wafers. Thus calibration in non-coaxial systems can be performed with a minimum of effort at maximum accuracy and dynamic range.
The Virtual Embedding Networks option enables virtual embedding of arbitrary linear two-port networks into the test setup. The required data are obtained from a measurement of the existing network or generated by CAE tools from the theoretical model.
In tests of components that have to be matched to a given impedance, the matching network can thus be taken into account through mathematical algorithms of ZVM and ZVK instead of using the physical network. This method guarantees high accuracy, ideal reproducibility and maximum reliability without any loss of speed - great advantages especially in production.
Conversely, by de-embedding, the influence of a known network can be eliminated. The S-parameters of a chip can be analyzed, compensating for the effects of its housing and bonding leads through de-embedding.
By transforming measurement data from the frequency to the time domain, discontinuities or impedances along the DUT can be displayed as a function of DUT length. With a maximum number of 2001 points, ZVM and ZVK can measure even very long DUTs with high resolution. Five filters allow the location of a discontinuity and the sidelobe suppression to be determined with optimum resolution. The S-parameters of a given discontinuity can be displayed in the time domain by setting a window (gating). An additional processor module included in the corresponding option accelerates data processing and the display of results to provide even realtime display - a valuable aid, for example in the tuning of bandpass filters with time domain transformation.
ZVM and ZVK are based on Windows NT. The user has complete access to the hard disk, the floppy disk drive and all interfaces of the internal PC. This allows, for example, the connection of an external monitor, the installation of any type of printer, or the use of software tools on ZVM or ZVK for result processing or control of the network analyzers via the IEC/ IEEE bus or an internal RSIB*) data bus. ZVM and ZVK can thus act as controllers of their own or for a complete test or production system. Moreover, the internal PC enables control and data exchange via Ethernet.
In the decoupled mode, the frequency grid, measurement bandwidth, calibration technique and measurement mode can be configured independently for each of the four display channels. In amplifier measurements, this allows the simultaneous measurement and display of important parameters in quasi-realtime, such as gain, compression point (power sweep) and harmonics versus power or frequency, or compression point versus frequency.
The Rohde&Schwarz two-port calibration techniques reduce the number of required calibration standards to a minimum of 2. This significantly cuts the time required for manual calibration. The short measurement time of <500 µs or <700 µs per point guarantees minimum sweep times through to realtime display. The output of a marker value via the IEC/IEEE bus takes less than 5 ms, the transfer of a complete trace (200 points) less than 15 ms. These features are the basis for the excellent performance of ZVM and ZVK both in manual operation and in automated test systems.
The ZVM and ZVK have two independent synthesizers for the generator and the receiver. In the receiver sections, fundamental mixing is used up to high frequencies to provide the excellent dynamic range and outstanding selectivity, enabling straightforward measurements on frequency-converting DUTs or DUTs with extremely high selectivity.
The ZVM and ZVK feature modern calibration techniques patented by Rohde & Schwarz that allow full two-port calibration using fewer or only partially known standards. This simplifies the design of calibration standards used for example in test fixtures or on wafers. Thus calibration in non-coaxial systems can be performed with a minimum of effort at maximum accuracy and dynamic range.
The Virtual Embedding Networks option enables virtual embedding of arbitrary linear two-port networks into the test setup. The required data are obtained from a measurement of the existing network or generated by CAE tools from the theoretical model.
In tests of components that have to be matched to a given impedance, the matching network can thus be taken into account through mathematical algorithms of ZVM and ZVK instead of using the physical network. This method guarantees high accuracy, ideal reproducibility and maximum reliability without any loss of speed - great advantages especially in production.
Conversely, by de-embedding, the influence of a known network can be eliminated. The S-parameters of a chip can be analyzed, compensating for the effects of its housing and bonding leads through de-embedding.
By transforming measurement data from the frequency to the time domain, discontinuities or impedances along the DUT can be displayed as a function of DUT length. With a maximum number of 2001 points, ZVM and ZVK can measure even very long DUTs with high resolution. Five filters allow the location of a discontinuity and the sidelobe suppression to be determined with optimum resolution. The S-parameters of a given discontinuity can be displayed in the time domain by setting a window (gating). An additional processor module included in the corresponding option accelerates data processing and the display of results to provide even realtime display - a valuable aid, for example in the tuning of bandpass filters with time domain transformation.
ZVM and ZVK are based on Windows NT. The user has complete access to the hard disk, the floppy disk drive and all interfaces of the internal PC. This allows, for example, the connection of an external monitor, the installation of any type of printer, or the use of software tools on ZVM or ZVK for result processing or control of the network analyzers via the IEC/ IEEE bus or an internal RSIB*) data bus. ZVM and ZVK can thus act as controllers of their own or for a complete test or production system. Moreover, the internal PC enables control and data exchange via Ethernet.
In the decoupled mode, the frequency grid, measurement bandwidth, calibration technique and measurement mode can be configured independently for each of the four display channels. In amplifier measurements, this allows the simultaneous measurement and display of important parameters in quasi-realtime, such as gain, compression point (power sweep) and harmonics versus power or frequency, or compression point versus frequency.
The Rohde&Schwarz two-port calibration techniques reduce the number of required calibration standards to a minimum of 2. This significantly cuts the time required for manual calibration. The short measurement time of <500 µs or <700 µs per point guarantees minimum sweep times through to realtime display. The output of a marker value via the IEC/IEEE bus takes less than 5 ms, the transfer of a complete trace (200 points) less than 15 ms. These features are the basis for the excellent performance of ZVM and ZVK both in manual operation and in automated test systems.
The Rohde & Schwarz 1046.5001.05 73 dB ZVM Step Attenuator may still be available for purchase and support from Artisan Technology Group beyond End-Of-Life (EOL) by the manufacturer (OEM).
73 dB ZVM Step Attenuator Price & Specs
Rohde & Schwarz 1046.5001.05 73 dB ZVM Step Attenuator Description
Functions
Provides precise signal attenuation up to 73 dB for ZVM vector network analyzers, enables accurate measurement of high-gain devices by extending the analyzer's dynamic range, supports a stepwise reduction of signal power, facilitates impedance matching in RF circuits, and allows calibrated measurements across different power levels while maintaining measurement accuracy and preventing receiver overload.
Platforms
Designed for vector network analyzer test setups and RF measurement systems operating from DC to microwave frequencies. Interfaces via precision coaxial connectors with 50-ohm impedance matching. Integrates with automated test equipment through mechanical or electronic control interfaces. Provides calibrated attenuation steps for dynamic range extension in VNA measurements, receiver sensitivity testing, and RF component characterization. Compatible with laboratory benchtop configurations and production test environments requiring precise signal level control and measurement uncertainty reduction.
Applications
High-precision programmable RF/microwave step attenuator providing 73 dB attenuation range with fine resolution steps. Utilized in automated test systems for receiver sensitivity testing, dynamic range measurements, signal level calibration, and path loss simulation. Common applications include characterizing receiver performance, establishing reference levels for network analyzer measurements, simulating variable signal conditions in communication system testing, and providing controlled signal reduction in EMC/EMI test setups. Integrates with test automation software via remote control interfaces for swept attenuation measurements and signal fading simulations.
Accessories
The device functions as a precision step attenuator delivering up to 73 dB attenuation with high accuracy and repeatability, designed for RF signal level control and calibration in test systems. It operates over a wide frequency range compatible with standard RF test equipment, typically within DC to several GHz. The step attenuator features mechanical switchable steps for fine attenuation adjustment, low insertion loss, and stable performance. It interfaces with rack-mounted test setups and may include front or rear RF connectors, with control options via manual or remote interfaces (e.g., LAN, USB). Common applications include RF signal conditioning, calibration, and measurement in laboratory and production environments.
Interfaces
50-ohm coaxial connectors with N-type female interfaces on input and output ports. DC control via multi-pin D-sub connector for remote attenuation setting. Manual front panel rotary switch for local control. Requires external DC power supply connection via dedicated power input connector. Compatible with ZVM vector network analyzer mainframe for integrated measurement applications.
Specifications
73 dB step attenuator designed for precision RF signal level control in test and measurement applications. Features discrete attenuation steps with high accuracy and repeatability across broadband frequency ranges. Interfaces through standard RF coaxial connectors with 50-ohm impedance matching. Provides stable insertion loss characteristics with low VSWR and minimal phase variation between steps. Commonly used in automated test equipment, network analyzers, signal generators, and receiver sensitivity measurements for calibrating signal paths and creating precise reference levels.
This section includes content generated with the assistance of artificial intelligence (AI) tools. AI is used to increase efficiency and provide timely information. Please note that the content may not have been reviewed for accuracy or completeness. Use this information at your own discretion, and verify details independently as needed.
Rohde & Schwarz 1046.5001.05 73 dB ZVM Step Attenuator Manuals, Datasheets, Drivers, Links
Rohde & Schwarz 1046.5001.05 73 dB ZVM Step Attenuator Specs
| General | |
|---|---|
| Manufacturer | Rohde & Schwarz |
| Model | 1046.5001.05 |
| Condition | Used and in Excellent Condition |
| Product Family | ZVM, ZVK |
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Important Notice: Other accessories, manuals, cables, calibration data, software, etc. are not included with this equipment unless listed in the above stock item description. All prices are shown in USD.
Artisan Scientific Corporation dba Artisan Technology Group is not affiliated with or a distributor for Rohde & Schwarz. The depiction, description, or sale of products featuring names, trademarks, brands, and logos is for identification and/or reference purposes only and does not indicate any affiliation with or authorization by any rights holder.
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