Stock #55192-7
$495.00USD
169 In StockUsed and in Excellent Condition
1046.5024.06 Rohde & Schwarz 70dB ZVM Step Attenuator
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Item details
| Part Number | 1046.5024.06 |
|---|---|
| In Stock | 11 |
| Available | Today |
| Location | Champaign, IL USAships worldwide |
| Stock # | 95403-4 |
| Ship Weight | 2 lbs /ea |
| Condition | Used and in Excellent Condition |
| Inspection | Before every shipment |
| Warranty | 1-Year Warranty with 30-Day Return Guarantee |
Description
Configuration:
• Frequency Range: DC-21 GHz
Part Number: 1046.5024.06
• Frequency Range: DC-21 GHz
Part Number: 1046.5024.06
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Rohde & Schwarz 1046.5024.06 70dB ZVM Step Attenuator Overview
Features:
- Excellent Dynamic Range
- Low Inherent Noise
- High Measurement Speed
- Fast Data Transfer via IEC/IEEE Bus
- Easy Integration Into PC Environment and Networks
The Rohde & Schwarz ZVM/ZVK Vector Network Analyzers are compact instruments
with integrated generator, two reference
and two receiver channels and a bidirectional test set. This can be extended by
attenuators with integrated switches in
the generator and receiver paths. With
this configuration, ZVM and ZVK offer
direct access to all reference and receiver
channels. This concept makes ZVM and
ZVK well equipped for complex test setups, for example for bidirectional measurements on power amplifiers.
The ZVM and ZVK have two independent synthesizers for the generator and the receiver. In the receiver sections, fundamental mixing is used up to high frequencies to provide the excellent dynamic range and outstanding selectivity, enabling straightforward measurements on frequency-converting DUTs or DUTs with extremely high selectivity.
The ZVM and ZVK feature modern calibration techniques patented by Rohde & Schwarz that allow full two-port calibration using fewer or only partially known standards. This simplifies the design of calibration standards used for example in test fixtures or on wafers. Thus calibration in non-coaxial systems can be performed with a minimum of effort at maximum accuracy and dynamic range.
The Virtual Embedding Networks option enables virtual embedding of arbitrary linear two-port networks into the test setup. The required data are obtained from a measurement of the existing network or generated by CAE tools from the theoretical model.
In tests of components that have to be matched to a given impedance, the matching network can thus be taken into account through mathematical algorithms of ZVM and ZVK instead of using the physical network. This method guarantees high accuracy, ideal reproducibility and maximum reliability without any loss of speed - great advantages especially in production.
Conversely, by de-embedding, the influence of a known network can be eliminated. The S-parameters of a chip can be analyzed, compensating for the effects of its housing and bonding leads through de-embedding.
By transforming measurement data from the frequency to the time domain, discontinuities or impedances along the DUT can be displayed as a function of DUT length. With a maximum number of 2001 points, ZVM and ZVK can measure even very long DUTs with high resolution. Five filters allow the location of a discontinuity and the sidelobe suppression to be determined with optimum resolution. The S-parameters of a given discontinuity can be displayed in the time domain by setting a window (gating). An additional processor module included in the corresponding option accelerates data processing and the display of results to provide even realtime display - a valuable aid, for example in the tuning of bandpass filters with time domain transformation.
ZVM and ZVK are based on Windows NT. The user has complete access to the hard disk, the floppy disk drive and all interfaces of the internal PC. This allows, for example, the connection of an external monitor, the installation of any type of printer, or the use of software tools on ZVM or ZVK for result processing or control of the network analyzers via the IEC/ IEEE bus or an internal RSIB*) data bus. ZVM and ZVK can thus act as controllers of their own or for a complete test or production system. Moreover, the internal PC enables control and data exchange via Ethernet.
In the decoupled mode, the frequency grid, measurement bandwidth, calibration technique and measurement mode can be configured independently for each of the four display channels. In amplifier measurements, this allows the simultaneous measurement and display of important parameters in quasi-realtime, such as gain, compression point (power sweep) and harmonics versus power or frequency, or compression point versus frequency.
The Rohde&Schwarz two-port calibration techniques reduce the number of required calibration standards to a minimum of 2. This significantly cuts the time required for manual calibration. The short measurement time of <500 µs or <700 µs per point guarantees minimum sweep times through to realtime display. The output of a marker value via the IEC/IEEE bus takes less than 5 ms, the transfer of a complete trace (200 points) less than 15 ms. These features are the basis for the excellent performance of ZVM and ZVK both in manual operation and in automated test systems.
The ZVM and ZVK have two independent synthesizers for the generator and the receiver. In the receiver sections, fundamental mixing is used up to high frequencies to provide the excellent dynamic range and outstanding selectivity, enabling straightforward measurements on frequency-converting DUTs or DUTs with extremely high selectivity.
The ZVM and ZVK feature modern calibration techniques patented by Rohde & Schwarz that allow full two-port calibration using fewer or only partially known standards. This simplifies the design of calibration standards used for example in test fixtures or on wafers. Thus calibration in non-coaxial systems can be performed with a minimum of effort at maximum accuracy and dynamic range.
The Virtual Embedding Networks option enables virtual embedding of arbitrary linear two-port networks into the test setup. The required data are obtained from a measurement of the existing network or generated by CAE tools from the theoretical model.
In tests of components that have to be matched to a given impedance, the matching network can thus be taken into account through mathematical algorithms of ZVM and ZVK instead of using the physical network. This method guarantees high accuracy, ideal reproducibility and maximum reliability without any loss of speed - great advantages especially in production.
Conversely, by de-embedding, the influence of a known network can be eliminated. The S-parameters of a chip can be analyzed, compensating for the effects of its housing and bonding leads through de-embedding.
By transforming measurement data from the frequency to the time domain, discontinuities or impedances along the DUT can be displayed as a function of DUT length. With a maximum number of 2001 points, ZVM and ZVK can measure even very long DUTs with high resolution. Five filters allow the location of a discontinuity and the sidelobe suppression to be determined with optimum resolution. The S-parameters of a given discontinuity can be displayed in the time domain by setting a window (gating). An additional processor module included in the corresponding option accelerates data processing and the display of results to provide even realtime display - a valuable aid, for example in the tuning of bandpass filters with time domain transformation.
ZVM and ZVK are based on Windows NT. The user has complete access to the hard disk, the floppy disk drive and all interfaces of the internal PC. This allows, for example, the connection of an external monitor, the installation of any type of printer, or the use of software tools on ZVM or ZVK for result processing or control of the network analyzers via the IEC/ IEEE bus or an internal RSIB*) data bus. ZVM and ZVK can thus act as controllers of their own or for a complete test or production system. Moreover, the internal PC enables control and data exchange via Ethernet.
In the decoupled mode, the frequency grid, measurement bandwidth, calibration technique and measurement mode can be configured independently for each of the four display channels. In amplifier measurements, this allows the simultaneous measurement and display of important parameters in quasi-realtime, such as gain, compression point (power sweep) and harmonics versus power or frequency, or compression point versus frequency.
The Rohde&Schwarz two-port calibration techniques reduce the number of required calibration standards to a minimum of 2. This significantly cuts the time required for manual calibration. The short measurement time of <500 µs or <700 µs per point guarantees minimum sweep times through to realtime display. The output of a marker value via the IEC/IEEE bus takes less than 5 ms, the transfer of a complete trace (200 points) less than 15 ms. These features are the basis for the excellent performance of ZVM and ZVK both in manual operation and in automated test systems.
The Rohde & Schwarz 1046.5024.06 70dB ZVM Step Attenuator may still be available for purchase and support from Artisan Technology Group beyond End-Of-Life (EOL) by the manufacturer (OEM).
70dB ZVM Step Attenuator Price & Specs
Rohde & Schwarz 1046.5024.06 70dB ZVM Step Attenuator Description
Functions
Provides electronically controlled, programmable attenuation of RF signals in discrete 10 dB steps, from 0 dB to a maximum of 70 dB. Designed for integration with vector network analyzers, it is used to precisely control signal power levels delivered to a device under test or to extend the measurement receiver's dynamic range. Control is managed through a dedicated interface, allowing for automated test sequences.
Platforms
Designed as a programmable step attenuator module with 70 dB attenuation range, operating from DC to 26.5 GHz, intended for integration in Rohde & Schwarz test equipment platforms such as FSEM20, FSEM30, FSP13, and FSP30 spectrum analyzers. It interfaces via standard 50 O RF connectors and provides precise signal level control to optimize dynamic range and measurement accuracy in high-frequency RF and microwave test systems. Commonly used for signal conditioning, calibration, and dynamic range management in EMI testing, spectrum analysis, and RF system characterization applications.
Applications
Precision signal level conditioning in RF/microwave test and measurement setups. Essential for extending the dynamic range of vector network analyzers, spectrum analyzers, and power meters. Utilized in linearity characterization of amplifiers, receiver sensitivity testing, and the emulation of controlled path loss in wireless communication systems. Facilitates precise calibration and ensures accurate measurement of high-power or low-power signals.
Accessories
Requires installation in a Rohde & Schwarz ZVM Vector Network Analyzer mainframe. This internal module provides 70 dB of attenuation for the ZVM's test ports. The user interface is through the instrument's front panel N-type female 50 Ohm connectors (Port 1, Port 2) and the ZVM's control interface. Internal connections are made to the ZVM backplane.
Interfaces
Contains a single Type N input and output RF connector (50 ohm), supporting a DC to 26.5 GHz frequency range. Features GPIB (IEEE-488) interface with 24-pin connector for remote control operations. Compatible with ZVM vector network analyzers through a dedicated control port. Includes SMA trigger input connector for synchronization with external equipment.
Specifications
A high-performance RF step attenuator module designed for vector network analyzer applications, providing precision 70dB attenuation range with electronically controlled switching in discrete steps. Operates within microwave frequency ranges with minimal insertion loss and excellent impedance matching. Integrates with vector measurement systems to extend dynamic range and protect sensitive receiver components from overload. Features reliable solid-state switching for high durability and consistent performance in automated test environments. Commonly used in production testing, component characterization, and laboratory measurement setups requiring accurate signal level control.
This section includes content generated with the assistance of artificial intelligence (AI) tools. AI is used to increase efficiency and provide timely information. Please note that the content may not have been reviewed for accuracy or completeness. Use this information at your own discretion, and verify details independently as needed.
Rohde & Schwarz 1046.5024.06 70dB ZVM Step Attenuator Manuals, Datasheets, Drivers, Links
Rohde & Schwarz 1046.5024.06 70dB ZVM Step Attenuator Specs
| General | |
|---|---|
| Manufacturer | Rohde & Schwarz |
| Model | 1046.5024.06 |
| Condition | Used and in Excellent Condition |
| Product Family | ZVM, ZVK |
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Important Notice: Other accessories, manuals, cables, calibration data, software, etc. are not included with this equipment unless listed in the above stock item description. All prices are shown in USD.
Artisan Scientific Corporation dba Artisan Technology Group is not affiliated with or a distributor for Rohde & Schwarz. The depiction, description, or sale of products featuring names, trademarks, brands, and logos is for identification and/or reference purposes only and does not indicate any affiliation with or authorization by any rights holder.
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