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A110 Rohde & Schwarz Converter Unit for ZV Series Vector Network Analyzer
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Item details
| Part Number | A110 |
|---|---|
| In Stock | 8 |
| Available | Today |
| Location | Champaign, IL USAships worldwide |
| Stock # | 95403-12 |
| Ship Weight | 5 lbs /ea |
| Condition | Used and in Excellent Condition |
| Inspection | Before every shipment |
| Warranty | 1-Year Warranty with 30-Day Return Guarantee |
Description
Part Number: 1127.8745.02
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Rohde & Schwarz A110 Converter Unit for ZV Series Vector Network Analyzer Overview
Features:
- Excellent Dynamic Range
- Low Inherent Noise
- High Measurement Speed
- Fast Data Transfer via IEC/IEEE Bus
- Easy Integration Into PC Environment and Networks
The Rohde & Schwarz ZVM/ZVK Vector Network Analyzers are compact instruments
with integrated generator, two reference
and two receiver channels and a bidirectional test set. This can be extended by
attenuators with integrated switches in
the generator and receiver paths. With
this configuration, ZVM and ZVK offer
direct access to all reference and receiver
channels. This concept makes ZVM and
ZVK well equipped for complex test setups, for example for bidirectional measurements on power amplifiers.
The ZVM and ZVK have two independent synthesizers for the generator and the receiver. In the receiver sections, fundamental mixing is used up to high frequencies to provide the excellent dynamic range and outstanding selectivity, enabling straightforward measurements on frequency-converting DUTs or DUTs with extremely high selectivity.
The ZVM and ZVK feature modern calibration techniques patented by Rohde & Schwarz that allow full two-port calibration using fewer or only partially known standards. This simplifies the design of calibration standards used for example in test fixtures or on wafers. Thus calibration in non-coaxial systems can be performed with a minimum of effort at maximum accuracy and dynamic range.
The Virtual Embedding Networks option enables virtual embedding of arbitrary linear two-port networks into the test setup. The required data are obtained from a measurement of the existing network or generated by CAE tools from the theoretical model.
In tests of components that have to be matched to a given impedance, the matching network can thus be taken into account through mathematical algorithms of ZVM and ZVK instead of using the physical network. This method guarantees high accuracy, ideal reproducibility and maximum reliability without any loss of speed - great advantages especially in production.
Conversely, by de-embedding, the influence of a known network can be eliminated. The S-parameters of a chip can be analyzed, compensating for the effects of its housing and bonding leads through de-embedding.
By transforming measurement data from the frequency to the time domain, discontinuities or impedances along the DUT can be displayed as a function of DUT length. With a maximum number of 2001 points, ZVM and ZVK can measure even very long DUTs with high resolution. Five filters allow the location of a discontinuity and the sidelobe suppression to be determined with optimum resolution. The S-parameters of a given discontinuity can be displayed in the time domain by setting a window (gating). An additional processor module included in the corresponding option accelerates data processing and the display of results to provide even realtime display - a valuable aid, for example in the tuning of bandpass filters with time domain transformation.
ZVM and ZVK are based on Windows NT. The user has complete access to the hard disk, the floppy disk drive and all interfaces of the internal PC. This allows, for example, the connection of an external monitor, the installation of any type of printer, or the use of software tools on ZVM or ZVK for result processing or control of the network analyzers via the IEC/ IEEE bus or an internal RSIB*) data bus. ZVM and ZVK can thus act as controllers of their own or for a complete test or production system. Moreover, the internal PC enables control and data exchange via Ethernet.
In the decoupled mode, the frequency grid, measurement bandwidth, calibration technique and measurement mode can be configured independently for each of the four display channels. In amplifier measurements, this allows the simultaneous measurement and display of important parameters in quasi-realtime, such as gain, compression point (power sweep) and harmonics versus power or frequency, or compression point versus frequency.
The Rohde&Schwarz two-port calibration techniques reduce the number of required calibration standards to a minimum of 2. This significantly cuts the time required for manual calibration. The short measurement time of <500 µs or <700 µs per point guarantees minimum sweep times through to realtime display. The output of a marker value via the IEC/IEEE bus takes less than 5 ms, the transfer of a complete trace (200 points) less than 15 ms. These features are the basis for the excellent performance of ZVM and ZVK both in manual operation and in automated test systems.
The ZVM and ZVK have two independent synthesizers for the generator and the receiver. In the receiver sections, fundamental mixing is used up to high frequencies to provide the excellent dynamic range and outstanding selectivity, enabling straightforward measurements on frequency-converting DUTs or DUTs with extremely high selectivity.
The ZVM and ZVK feature modern calibration techniques patented by Rohde & Schwarz that allow full two-port calibration using fewer or only partially known standards. This simplifies the design of calibration standards used for example in test fixtures or on wafers. Thus calibration in non-coaxial systems can be performed with a minimum of effort at maximum accuracy and dynamic range.
The Virtual Embedding Networks option enables virtual embedding of arbitrary linear two-port networks into the test setup. The required data are obtained from a measurement of the existing network or generated by CAE tools from the theoretical model.
In tests of components that have to be matched to a given impedance, the matching network can thus be taken into account through mathematical algorithms of ZVM and ZVK instead of using the physical network. This method guarantees high accuracy, ideal reproducibility and maximum reliability without any loss of speed - great advantages especially in production.
Conversely, by de-embedding, the influence of a known network can be eliminated. The S-parameters of a chip can be analyzed, compensating for the effects of its housing and bonding leads through de-embedding.
By transforming measurement data from the frequency to the time domain, discontinuities or impedances along the DUT can be displayed as a function of DUT length. With a maximum number of 2001 points, ZVM and ZVK can measure even very long DUTs with high resolution. Five filters allow the location of a discontinuity and the sidelobe suppression to be determined with optimum resolution. The S-parameters of a given discontinuity can be displayed in the time domain by setting a window (gating). An additional processor module included in the corresponding option accelerates data processing and the display of results to provide even realtime display - a valuable aid, for example in the tuning of bandpass filters with time domain transformation.
ZVM and ZVK are based on Windows NT. The user has complete access to the hard disk, the floppy disk drive and all interfaces of the internal PC. This allows, for example, the connection of an external monitor, the installation of any type of printer, or the use of software tools on ZVM or ZVK for result processing or control of the network analyzers via the IEC/ IEEE bus or an internal RSIB*) data bus. ZVM and ZVK can thus act as controllers of their own or for a complete test or production system. Moreover, the internal PC enables control and data exchange via Ethernet.
In the decoupled mode, the frequency grid, measurement bandwidth, calibration technique and measurement mode can be configured independently for each of the four display channels. In amplifier measurements, this allows the simultaneous measurement and display of important parameters in quasi-realtime, such as gain, compression point (power sweep) and harmonics versus power or frequency, or compression point versus frequency.
The Rohde&Schwarz two-port calibration techniques reduce the number of required calibration standards to a minimum of 2. This significantly cuts the time required for manual calibration. The short measurement time of <500 µs or <700 µs per point guarantees minimum sweep times through to realtime display. The output of a marker value via the IEC/IEEE bus takes less than 5 ms, the transfer of a complete trace (200 points) less than 15 ms. These features are the basis for the excellent performance of ZVM and ZVK both in manual operation and in automated test systems.
The Rohde & Schwarz A110 Converter Unit for ZV Series Vector Network Analyzer may still be available for purchase and support from Artisan Technology Group beyond End-Of-Life (EOL) by the manufacturer (OEM).
Converter Unit for ZV Series Vector Network Analyzer Price & Specs
Rohde & Schwarz A110 Converter Unit for ZV Series Vector Network Analyzer Description
Functions
Performs frequency conversion and signal conditioning functions to enable the vector network analyzer to measure network parameters across different frequency bands. Interfaces with the main analyzer chassis through standard connectors, integrating RF input/output paths with local oscillator signals. Designed for installation within modular analyzer platforms, supporting precise calibration and high dynamic range measurements in microwave and millimeter-wave device characterization applications.
Platforms
RF/microwave test system component designed for frequency extension of vector network analyzers. Operates in a laboratory or production test environment with input from RF signal generators and output to ZVM vector network analyzers. Interfaces via coaxial RF connectors for signal transfer and system cables for control and power. Compatible with ZVM test sets, calibration kits, and measurement software. Used in characterization, verification, and production testing of microwave components, devices, and systems, enabling accurate s-parameter measurements at extended frequency ranges.
Applications
Designed to extend the frequency range of the associated vector network analyzer, this converter unit enables high-frequency measurements up to 110 GHz by performing frequency up- and down-conversion at the device under test (DUT). It integrates with external test sets and diplexers to facilitate precise calibration and measurement of RF and microwave components, antennas, and modules in advanced wireless communications, radar systems development, and mmWave device characterization. Its compact design minimizes signal loss and ripple by allowing close placement to the DUT for enhanced measurement accuracy in demanding high-frequency test environments.
Accessories
Requires R&S ZVM vector network analyzer as the main control unit. Features two N-type female RF connectors (50 ohm impedance) for signal input/output, a multi-pin control interface for connection to ZVM mainframe, and power input via ZVM system bus. Compatible with ZVM-B1 external frequency conversion kit and ZVM-B4 bias network accessory. Needs calibration kit matching the frequency range for accurate measurements.
Interfaces
Front panel BNC female for RF input/output connection to DUT, rear panel 15-pin D-sub connector for control and power from ZVM mainframe, proprietary multi-pin interface for direct connection to ZVM test set port, integrated N-type or 3.5mm precision RF connectors depending on frequency range configuration, requires ZVM mainframe with compatible firmware version and test set, DC power supplied through mainframe connection, no external power adapter needed, supports remote control via mainframe GPIB/IEEE-488 or RS-232 interfaces
Specifications
The A110 Converter Unit extends the frequency range of the Vector Network Analyzer. It operates as a frequency converter, allowing measurements beyond the base unit's capabilities, typically utilizing an external test port connection. The unit interfaces via a dedicated connection to the VNA, providing local oscillator and intermediate frequency signals. Common applications include extended frequency range S-parameter measurements.
This section includes content generated with the assistance of artificial intelligence (AI) tools. AI is used to increase efficiency and provide timely information. Please note that the content may not have been reviewed for accuracy or completeness. Use this information at your own discretion, and verify details independently as needed.
Rohde & Schwarz A110 Converter Unit for ZV Series Vector Network Analyzer Manuals, Datasheets, Drivers, Links
Rohde & Schwarz A110 Converter Unit for ZV Series Vector Network Analyzer Specs
| General | |
|---|---|
| Manufacturer | Rohde & Schwarz |
| Model | A110 |
| Condition | Used and in Excellent Condition |
| Product Family | ZVM, ZVK |
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Important Notice: Other accessories, manuals, cables, calibration data, software, etc. are not included with this equipment unless listed in the above stock item description. All prices are shown in USD.
Artisan Scientific Corporation dba Artisan Technology Group is not affiliated with or a distributor for Rohde & Schwarz. The depiction, description, or sale of products featuring names, trademarks, brands, and logos is for identification and/or reference purposes only and does not indicate any affiliation with or authorization by any rights holder.
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