A150 Rohde & Schwarz Source Control Unit for ZV Series Vector Network Analyzer
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Item details
| Part Number | A150 |
|---|---|
| In Stock | 8 |
| Available | Today |
| Location | Champaign, IL USAships worldwide |
| Stock # | 95403-15 |
| Ship Weight | 5 lbs /ea |
| Condition | Used and in Excellent Condition |
| Inspection | Before every shipment |
| Warranty | 1-Year Warranty with 30-Day Return Guarantee |
Description
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Rohde & Schwarz A150 Source Control Unit for ZV Series Vector Network Analyzer Overview
Features:
- Excellent Dynamic Range
- Low Inherent Noise
- High Measurement Speed
- Fast Data Transfer via IEC/IEEE Bus
- Easy Integration Into PC Environment and Networks
The ZVM and ZVK have two independent synthesizers for the generator and the receiver. In the receiver sections, fundamental mixing is used up to high frequencies to provide the excellent dynamic range and outstanding selectivity, enabling straightforward measurements on frequency-converting DUTs or DUTs with extremely high selectivity.
The ZVM and ZVK feature modern calibration techniques patented by Rohde & Schwarz that allow full two-port calibration using fewer or only partially known standards. This simplifies the design of calibration standards used for example in test fixtures or on wafers. Thus calibration in non-coaxial systems can be performed with a minimum of effort at maximum accuracy and dynamic range.
The Virtual Embedding Networks option enables virtual embedding of arbitrary linear two-port networks into the test setup. The required data are obtained from a measurement of the existing network or generated by CAE tools from the theoretical model.
In tests of components that have to be matched to a given impedance, the matching network can thus be taken into account through mathematical algorithms of ZVM and ZVK instead of using the physical network. This method guarantees high accuracy, ideal reproducibility and maximum reliability without any loss of speed - great advantages especially in production.
Conversely, by de-embedding, the influence of a known network can be eliminated. The S-parameters of a chip can be analyzed, compensating for the effects of its housing and bonding leads through de-embedding.
By transforming measurement data from the frequency to the time domain, discontinuities or impedances along the DUT can be displayed as a function of DUT length. With a maximum number of 2001 points, ZVM and ZVK can measure even very long DUTs with high resolution. Five filters allow the location of a discontinuity and the sidelobe suppression to be determined with optimum resolution. The S-parameters of a given discontinuity can be displayed in the time domain by setting a window (gating). An additional processor module included in the corresponding option accelerates data processing and the display of results to provide even realtime display - a valuable aid, for example in the tuning of bandpass filters with time domain transformation.
ZVM and ZVK are based on Windows NT. The user has complete access to the hard disk, the floppy disk drive and all interfaces of the internal PC. This allows, for example, the connection of an external monitor, the installation of any type of printer, or the use of software tools on ZVM or ZVK for result processing or control of the network analyzers via the IEC/ IEEE bus or an internal RSIB*) data bus. ZVM and ZVK can thus act as controllers of their own or for a complete test or production system. Moreover, the internal PC enables control and data exchange via Ethernet.
In the decoupled mode, the frequency grid, measurement bandwidth, calibration technique and measurement mode can be configured independently for each of the four display channels. In amplifier measurements, this allows the simultaneous measurement and display of important parameters in quasi-realtime, such as gain, compression point (power sweep) and harmonics versus power or frequency, or compression point versus frequency.
The Rohde&Schwarz two-port calibration techniques reduce the number of required calibration standards to a minimum of 2. This significantly cuts the time required for manual calibration. The short measurement time of <500 µs or <700 µs per point guarantees minimum sweep times through to realtime display. The output of a marker value via the IEC/IEEE bus takes less than 5 ms, the transfer of a complete trace (200 points) less than 15 ms. These features are the basis for the excellent performance of ZVM and ZVK both in manual operation and in automated test systems.
The Rohde & Schwarz A150 Source Control Unit for ZV Series Vector Network Analyzer may still be available for purchase and support from Artisan Technology Group beyond End-Of-Life (EOL) by the manufacturer (OEM).
Source Control Unit for ZV Series Vector Network Analyzer Price & Specs
Rohde & Schwarz A150 Source Control Unit for ZV Series Vector Network Analyzer Description
Functions
Generates and precisely controls RF/microwave test signals, including frequency, power level, and sweep parameters, for a vector network analyzer. It provides stable and accurate excitation to the device under test and synchronizes the source output with the measurement acquisition system, enabling comprehensive S-parameter characterization.
Platforms
Multi-channel RF source control platform designed for ZVM vector network analyzer systems. Provides synchronized frequency synthesis and power control for S-parameter measurements across multiple test ports. Features high-stability reference oscillator distribution, phase-coherent LO generation, and precision leveled RF outputs. Interfaces via proprietary digital control bus to coordinate stimulus signals with receiver channels. Supports frequency ranges from 10 MHz to 20 GHz with phase noise performance optimized for vector measurements. Includes temperature-compensated power control loops and built-in calibration routines. Enables full vector network analysis capabilities including multiport S-parameter characterization, mixer measurements, and pulsed-RF applications in automated test environments.
Applications
Controls and manages signal generation for ZVM vector network analyzer measurements. Provides precise frequency synthesis and power control for test signals across measurement ports. Interfaces directly with ZVM mainframe via proprietary bus architecture to coordinate stimulus-response measurements. Enables automated calibration routines, power sweeps, and frequency sweeps through software control. Supports multi-port configurations for differential and balanced device characterization. Essential for S-parameter measurements, time-domain analysis, and impedance testing of RF/microwave components, filters, amplifiers, and antennas. Commonly used in R&D laboratories, production testing environments, and field service applications requiring accurate vector network analysis.
Accessories
Source Control Unit interfaces include USB for remote control and data transfer, GPIB for legacy instrumentation communication, LAN for network connectivity, and digital I/Os for trigger and synchronization. Rear panel connectors feature DisplayPort and DVI-D for external displays, power supply input, and optional modules with trigger inputs/outputs, pulse modulator controls, RF interlock input, and reference frequency I/O (1 MHz to 1 GHz range). The unit may require calibration units, power sensors, and storage media connected via USB. Optional internal local oscillators support extended frequency setups up to 26.5 GHz.
Interfaces
Ethernet 10/100 RJ-45 connector for network communication. USB 2.0 Type-A host ports for external devices. USB 2.0 Type-B device port for computer connection. GPIB IEEE-488.2 24-pin connector for instrument control. RS-232 9-pin D-sub serial interface. BNC connectors for external reference clock input/output 10 MHz. Trigger input/output BNC connectors for measurement synchronization. DVI-D digital video output connector for external monitor. Audio output 3.5mm stereo jack.
Specifications
Source control unit for ZVM vector network analyzer, designed for monitoring and controlling external signal sources during network analysis measurements. Features programmable calibration data, precise signal source parameter configuration, and automated sweep control functionality. Provides high-precision frequency coordination and power level regulation, integrating with vector network analyzer systems for accurate device characterization. Supports multiple source management for complex multi-tone or intermodulation distortion testing. Enables synchronized stimulus-response measurements across multiple test ports in RF/microwave measurement environments. Expands system measurement capabilities for active device characterization requiring external signal stimuli.
This section includes content generated with the assistance of artificial intelligence (AI) tools. AI is used to increase efficiency and provide timely information. Please note that the content may not have been reviewed for accuracy or completeness. Use this information at your own discretion, and verify details independently as needed.
Rohde & Schwarz A150 Source Control Unit for ZV Series Vector Network Analyzer Manuals, Datasheets, Drivers, Links
Rohde & Schwarz A150 Source Control Unit for ZV Series Vector Network Analyzer Specs
| General | |
|---|---|
| Manufacturer | Rohde & Schwarz |
| Model | A150 |
| Condition | Used and in Excellent Condition |
| Product Family | ZVM, ZVK |
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Important Notice: Other accessories, manuals, cables, calibration data, software, etc. are not included with this equipment unless listed in the above stock item description. All prices are shown in USD.
Artisan Scientific Corporation dba Artisan Technology Group is not affiliated with or a distributor for Rohde & Schwarz. The depiction, description, or sale of products featuring names, trademarks, brands, and logos is for identification and/or reference purposes only and does not indicate any affiliation with or authorization by any rights holder.
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