Stock #85207-1
$2,445.00USD
1 In StockUsed and in Excellent Condition
A130 Rohde & Schwarz Synthesizer Unit for ZV Series Vector Network Analyzer
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Item details
| Part Number | A130 |
|---|---|
| In Stock | 8 |
| Available | Today |
| Location | Champaign, IL USAships worldwide |
| Stock # | 95403-16 |
| Ship Weight | 4 lbs /ea |
| Condition | Used and in Excellent Condition |
| Inspection | Before every shipment |
| Warranty | 1-Year Warranty with 30-Day Return Guarantee |
Description
Part Number: 1043.2999.06
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Rohde & Schwarz A130 Synthesizer Unit for ZV Series Vector Network Analyzer Overview
Features:
- Excellent Dynamic Range
- Low Inherent Noise
- High Measurement Speed
- Fast Data Transfer via IEC/IEEE Bus
- Easy Integration Into PC Environment and Networks
The Rohde & Schwarz ZVM/ZVK Vector Network Analyzers are compact instruments
with integrated generator, two reference
and two receiver channels and a bidirectional test set. This can be extended by
attenuators with integrated switches in
the generator and receiver paths. With
this configuration, ZVM and ZVK offer
direct access to all reference and receiver
channels. This concept makes ZVM and
ZVK well equipped for complex test setups, for example for bidirectional measurements on power amplifiers.
The ZVM and ZVK have two independent synthesizers for the generator and the receiver. In the receiver sections, fundamental mixing is used up to high frequencies to provide the excellent dynamic range and outstanding selectivity, enabling straightforward measurements on frequency-converting DUTs or DUTs with extremely high selectivity.
The ZVM and ZVK feature modern calibration techniques patented by Rohde & Schwarz that allow full two-port calibration using fewer or only partially known standards. This simplifies the design of calibration standards used for example in test fixtures or on wafers. Thus calibration in non-coaxial systems can be performed with a minimum of effort at maximum accuracy and dynamic range.
The Virtual Embedding Networks option enables virtual embedding of arbitrary linear two-port networks into the test setup. The required data are obtained from a measurement of the existing network or generated by CAE tools from the theoretical model.
In tests of components that have to be matched to a given impedance, the matching network can thus be taken into account through mathematical algorithms of ZVM and ZVK instead of using the physical network. This method guarantees high accuracy, ideal reproducibility and maximum reliability without any loss of speed - great advantages especially in production.
Conversely, by de-embedding, the influence of a known network can be eliminated. The S-parameters of a chip can be analyzed, compensating for the effects of its housing and bonding leads through de-embedding.
By transforming measurement data from the frequency to the time domain, discontinuities or impedances along the DUT can be displayed as a function of DUT length. With a maximum number of 2001 points, ZVM and ZVK can measure even very long DUTs with high resolution. Five filters allow the location of a discontinuity and the sidelobe suppression to be determined with optimum resolution. The S-parameters of a given discontinuity can be displayed in the time domain by setting a window (gating). An additional processor module included in the corresponding option accelerates data processing and the display of results to provide even realtime display - a valuable aid, for example in the tuning of bandpass filters with time domain transformation.
ZVM and ZVK are based on Windows NT. The user has complete access to the hard disk, the floppy disk drive and all interfaces of the internal PC. This allows, for example, the connection of an external monitor, the installation of any type of printer, or the use of software tools on ZVM or ZVK for result processing or control of the network analyzers via the IEC/ IEEE bus or an internal RSIB*) data bus. ZVM and ZVK can thus act as controllers of their own or for a complete test or production system. Moreover, the internal PC enables control and data exchange via Ethernet.
In the decoupled mode, the frequency grid, measurement bandwidth, calibration technique and measurement mode can be configured independently for each of the four display channels. In amplifier measurements, this allows the simultaneous measurement and display of important parameters in quasi-realtime, such as gain, compression point (power sweep) and harmonics versus power or frequency, or compression point versus frequency.
The Rohde&Schwarz two-port calibration techniques reduce the number of required calibration standards to a minimum of 2. This significantly cuts the time required for manual calibration. The short measurement time of <500 µs or <700 µs per point guarantees minimum sweep times through to realtime display. The output of a marker value via the IEC/IEEE bus takes less than 5 ms, the transfer of a complete trace (200 points) less than 15 ms. These features are the basis for the excellent performance of ZVM and ZVK both in manual operation and in automated test systems.
The ZVM and ZVK have two independent synthesizers for the generator and the receiver. In the receiver sections, fundamental mixing is used up to high frequencies to provide the excellent dynamic range and outstanding selectivity, enabling straightforward measurements on frequency-converting DUTs or DUTs with extremely high selectivity.
The ZVM and ZVK feature modern calibration techniques patented by Rohde & Schwarz that allow full two-port calibration using fewer or only partially known standards. This simplifies the design of calibration standards used for example in test fixtures or on wafers. Thus calibration in non-coaxial systems can be performed with a minimum of effort at maximum accuracy and dynamic range.
The Virtual Embedding Networks option enables virtual embedding of arbitrary linear two-port networks into the test setup. The required data are obtained from a measurement of the existing network or generated by CAE tools from the theoretical model.
In tests of components that have to be matched to a given impedance, the matching network can thus be taken into account through mathematical algorithms of ZVM and ZVK instead of using the physical network. This method guarantees high accuracy, ideal reproducibility and maximum reliability without any loss of speed - great advantages especially in production.
Conversely, by de-embedding, the influence of a known network can be eliminated. The S-parameters of a chip can be analyzed, compensating for the effects of its housing and bonding leads through de-embedding.
By transforming measurement data from the frequency to the time domain, discontinuities or impedances along the DUT can be displayed as a function of DUT length. With a maximum number of 2001 points, ZVM and ZVK can measure even very long DUTs with high resolution. Five filters allow the location of a discontinuity and the sidelobe suppression to be determined with optimum resolution. The S-parameters of a given discontinuity can be displayed in the time domain by setting a window (gating). An additional processor module included in the corresponding option accelerates data processing and the display of results to provide even realtime display - a valuable aid, for example in the tuning of bandpass filters with time domain transformation.
ZVM and ZVK are based on Windows NT. The user has complete access to the hard disk, the floppy disk drive and all interfaces of the internal PC. This allows, for example, the connection of an external monitor, the installation of any type of printer, or the use of software tools on ZVM or ZVK for result processing or control of the network analyzers via the IEC/ IEEE bus or an internal RSIB*) data bus. ZVM and ZVK can thus act as controllers of their own or for a complete test or production system. Moreover, the internal PC enables control and data exchange via Ethernet.
In the decoupled mode, the frequency grid, measurement bandwidth, calibration technique and measurement mode can be configured independently for each of the four display channels. In amplifier measurements, this allows the simultaneous measurement and display of important parameters in quasi-realtime, such as gain, compression point (power sweep) and harmonics versus power or frequency, or compression point versus frequency.
The Rohde&Schwarz two-port calibration techniques reduce the number of required calibration standards to a minimum of 2. This significantly cuts the time required for manual calibration. The short measurement time of <500 µs or <700 µs per point guarantees minimum sweep times through to realtime display. The output of a marker value via the IEC/IEEE bus takes less than 5 ms, the transfer of a complete trace (200 points) less than 15 ms. These features are the basis for the excellent performance of ZVM and ZVK both in manual operation and in automated test systems.
The Rohde & Schwarz A130 Synthesizer Unit for ZV Series Vector Network Analyzer may still be available for purchase and support from Artisan Technology Group beyond End-Of-Life (EOL) by the manufacturer (OEM).
Synthesizer Unit for ZV Series Vector Network Analyzer Price & Specs
Rohde & Schwarz A130 Synthesizer Unit for ZV Series Vector Network Analyzer Description
Functions
Generates radio frequency signals for the ZVM Vector Network Analyzer. Provides precise, stable signal sources for measurements in specific frequency bands. Enables comprehensive S-parameter characterization of RF components and devices. Facilitates calibrated measurements of transmission and reflection characteristics. Integrates with the analyzer's measurement system to support vector error correction and accurate phase/amplitude measurements across the operational frequency range.
Platforms
A modular component generating highly stable, spectrally pure RF/microwave signals for vector network analysis within a ZVM mainframe. It supplies precisely controlled frequency sweeps and continuous wave outputs, feeding internal measurement receivers. This unit interfaces internally with the host analyzer's processing and display systems, receiving power and control instructions. Core applications include S-parameter, impedance, and gain/phase characterization of RF components and systems in research, development, and manufacturing.
Applications
Multi-port S-parameter characterization of active and passive RF/microwave components like filters, amplifiers, and mixers. Enables frequency-converting measurements, including conversion loss/gain and group delay on up/downconverters by providing independent, phase-coherent stimulus and local oscillator signals. Supports non-linear device analysis through intermodulation distortion (IMD) and harmonic measurements. Essential for high-speed automated production testing and R&D device verification requiring precise, fast-sweeping frequency and power control. Pulsed-RF characterization for aerospace and defense components.
Accessories
Requires ZVM Vector Network Analyzer mainframe for operation. Connects via internal backplane interface with proprietary multi-pin connector. No external power supply needed as unit draws power from ZVM chassis. Compatible with ZVM frequency extension modules and calibration kits. May require specific firmware version in ZVM mainframe. Installation requires ZVM service manual and proper ESD handling procedures.
Interfaces
Contains two 36-pin female D-sub connectors for digital control and two SMA female coaxial RF connectors. Integrates with ZVM Vector Network Analyzer via proprietary digital bus protocol. Provides synthesized RF output signals with phase-coherent operation. Requires specific RF cables with male SMA connectors rated for microwave frequencies. Compatible only with ZVM mainframe, not standalone operation.
Specifications
Frequency synthesis module providing stable local oscillator signals for ZVM vector network analyzer measurements. Generates phase-locked reference frequencies with low phase noise and high spectral purity across microwave bands. Integrates via proprietary backplane interface to synchronize with ZVM mainframe timing and control systems. Delivers multiple synthesized outputs for receiver downconversion and source stimulus generation. Features fast frequency switching, fine frequency resolution, and temperature-compensated oscillators for measurement accuracy. Enables S-parameter characterization, time domain analysis, and mixer measurements in RF and microwave test applications requiring precision frequency generation and phase coherence.
This section includes content generated with the assistance of artificial intelligence (AI) tools. AI is used to increase efficiency and provide timely information. Please note that the content may not have been reviewed for accuracy or completeness. Use this information at your own discretion, and verify details independently as needed.
Rohde & Schwarz A130 Synthesizer Unit for ZV Series Vector Network Analyzer Manuals, Datasheets, Drivers, Links
Rohde & Schwarz A130 Synthesizer Unit for ZV Series Vector Network Analyzer Specs
| General | |
|---|---|
| Manufacturer | Rohde & Schwarz |
| Model | A130 |
| Condition | Used and in Excellent Condition |
| Product Family | ZVM, ZVK |
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Important Notice: Other accessories, manuals, cables, calibration data, software, etc. are not included with this equipment unless listed in the above stock item description. All prices are shown in USD.
Artisan Scientific Corporation dba Artisan Technology Group is not affiliated with or a distributor for Rohde & Schwarz. The depiction, description, or sale of products featuring names, trademarks, brands, and logos is for identification and/or reference purposes only and does not indicate any affiliation with or authorization by any rights holder.
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