A360 Rohde & Schwarz I/O Board for ZV Series Vector Network Analyzer
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Item details
| Part Number | A360 |
|---|---|
| In Stock | 8 |
| Available | Today |
| Location | Champaign, IL USAships worldwide |
| Stock # | 95403-19 |
| Ship Weight | 2 lbs /ea |
| Condition | Used and in Excellent Condition |
| Inspection | Before every shipment |
| Warranty | 1-Year Warranty with 30-Day Return Guarantee |
Description
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Rohde & Schwarz A360 I/O Board for ZV Series Vector Network Analyzer Overview
Features:
- Excellent Dynamic Range
- Low Inherent Noise
- High Measurement Speed
- Fast Data Transfer via IEC/IEEE Bus
- Easy Integration Into PC Environment and Networks
The ZVM and ZVK have two independent synthesizers for the generator and the receiver. In the receiver sections, fundamental mixing is used up to high frequencies to provide the excellent dynamic range and outstanding selectivity, enabling straightforward measurements on frequency-converting DUTs or DUTs with extremely high selectivity.
The ZVM and ZVK feature modern calibration techniques patented by Rohde & Schwarz that allow full two-port calibration using fewer or only partially known standards. This simplifies the design of calibration standards used for example in test fixtures or on wafers. Thus calibration in non-coaxial systems can be performed with a minimum of effort at maximum accuracy and dynamic range.
The Virtual Embedding Networks option enables virtual embedding of arbitrary linear two-port networks into the test setup. The required data are obtained from a measurement of the existing network or generated by CAE tools from the theoretical model.
In tests of components that have to be matched to a given impedance, the matching network can thus be taken into account through mathematical algorithms of ZVM and ZVK instead of using the physical network. This method guarantees high accuracy, ideal reproducibility and maximum reliability without any loss of speed - great advantages especially in production.
Conversely, by de-embedding, the influence of a known network can be eliminated. The S-parameters of a chip can be analyzed, compensating for the effects of its housing and bonding leads through de-embedding.
By transforming measurement data from the frequency to the time domain, discontinuities or impedances along the DUT can be displayed as a function of DUT length. With a maximum number of 2001 points, ZVM and ZVK can measure even very long DUTs with high resolution. Five filters allow the location of a discontinuity and the sidelobe suppression to be determined with optimum resolution. The S-parameters of a given discontinuity can be displayed in the time domain by setting a window (gating). An additional processor module included in the corresponding option accelerates data processing and the display of results to provide even realtime display - a valuable aid, for example in the tuning of bandpass filters with time domain transformation.
ZVM and ZVK are based on Windows NT. The user has complete access to the hard disk, the floppy disk drive and all interfaces of the internal PC. This allows, for example, the connection of an external monitor, the installation of any type of printer, or the use of software tools on ZVM or ZVK for result processing or control of the network analyzers via the IEC/ IEEE bus or an internal RSIB*) data bus. ZVM and ZVK can thus act as controllers of their own or for a complete test or production system. Moreover, the internal PC enables control and data exchange via Ethernet.
In the decoupled mode, the frequency grid, measurement bandwidth, calibration technique and measurement mode can be configured independently for each of the four display channels. In amplifier measurements, this allows the simultaneous measurement and display of important parameters in quasi-realtime, such as gain, compression point (power sweep) and harmonics versus power or frequency, or compression point versus frequency.
The Rohde&Schwarz two-port calibration techniques reduce the number of required calibration standards to a minimum of 2. This significantly cuts the time required for manual calibration. The short measurement time of <500 µs or <700 µs per point guarantees minimum sweep times through to realtime display. The output of a marker value via the IEC/IEEE bus takes less than 5 ms, the transfer of a complete trace (200 points) less than 15 ms. These features are the basis for the excellent performance of ZVM and ZVK both in manual operation and in automated test systems.
The Rohde & Schwarz A360 I/O Board for ZV Series Vector Network Analyzer may still be available for purchase and support from Artisan Technology Group beyond End-Of-Life (EOL) by the manufacturer (OEM).
I/O Board for ZV Series Vector Network Analyzer Price & Specs
Rohde & Schwarz A360 I/O Board for ZV Series Vector Network Analyzer Description
Functions
Provides extended I/O capabilities for a Vector Network Analyzer, enabling integration into automated test environments. Functions include parallel digital I/O lines for control/status, external trigger input/output for measurement synchronization, and an analog output voltage proportional to a stimulus parameter. Facilitates control of external component handlers, wafer probers, and RF switching units via a D-sub user port and BNC connectors.
Platforms
Designed for integration within a vector network analyzer hardware chassis, this I/O board facilitates high-speed, high-accuracy RF signal routing and measurement data transfer. It interfaces through precision coaxial connectors and digital signal lines with both the instrument’s core processing module and external measurement fixtures, enabling calibrated S-parameter acquisition. Common applications include RF component characterization, antenna analysis, and material property measurements in research and production testing environments.
Applications
Designed for integration within the ZVM vector network analyzer framework, this I/O board facilitates the transmission and reception of high-frequency RF test signals, enabling precise network parameter measurements. It interfaces via standardized connectors to signal sources, receivers, and control units, ensuring synchronized data acquisition and control. Common applications include S-parameter characterization, component and material analysis, antenna testing, and verification of RF circuit integrity in R&D and quality assurance environments.
Accessories
Associated equipment: Vector Network Analyzer mainframe chassis. Interfaces: D-Sub 15-pin female connector, providing general-purpose digital input/output (e.g., 8 TTL/CMOS inputs, 8 TTL/CMOS outputs). Required accessories: D-Sub 15-pin male to male or bare-wire cables for digital control.
Interfaces
Equipped with a standard connector interface designed for integration into the ZVM vector network analyzer backplane, typically featuring a multi-pin board edge connector compatible with system chassis slots; supports high-speed digital I/O lines for control and data transfer between the I/O board and mainframe; includes RF test ports via SMA connectors for signal input/output corresponding to network analyzer RF paths. Exact connector counts and pin types are aligned with the ZVM mainframe architecture for synchronous measurement control and data acquisition.
Specifications
High-speed digital interface board providing parallel and serial communication between ZVM vector network analyzer mainframe and external test equipment. Features multiple TTL-compatible I/O ports, trigger inputs/outputs, and handshake signals for automated test sequencing. Supports real-time data acquisition and control signals with microsecond-level timing precision. Interfaces through proprietary backplane connector enabling direct memory access to measurement data. Commonly used in production test systems requiring synchronized measurements with handlers, probers, or custom test fixtures. Enables integration with GPIB/LAN-controlled test environments for complex multi-instrument setups in RF component characterization and S-parameter measurements.
This section includes content generated with the assistance of artificial intelligence (AI) tools. AI is used to increase efficiency and provide timely information. Please note that the content may not have been reviewed for accuracy or completeness. Use this information at your own discretion, and verify details independently as needed.
Rohde & Schwarz A360 I/O Board for ZV Series Vector Network Analyzer Manuals, Datasheets, Drivers, Links
Rohde & Schwarz A360 I/O Board for ZV Series Vector Network Analyzer Specs
| General | |
|---|---|
| Manufacturer | Rohde & Schwarz |
| Model | A360 |
| Condition | Used and in Excellent Condition |
| Product Family | ZVM, ZVK |
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Important Notice: Other accessories, manuals, cables, calibration data, software, etc. are not included with this equipment unless listed in the above stock item description. All prices are shown in USD.
Artisan Scientific Corporation dba Artisan Technology Group is not affiliated with or a distributor for Rohde & Schwarz. The depiction, description, or sale of products featuring names, trademarks, brands, and logos is for identification and/or reference purposes only and does not indicate any affiliation with or authorization by any rights holder.
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