Stock #75407-5
Out of StockUsed and in Excellent Condition
1127.9641.00 Rohde & Schwarz Front Panel Display for ZVM Vector Network Analyzer
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Item details
| Part Number | 1127.9641.00 |
|---|---|
| In Stock | 4 |
| Available | Today |
| Location | Champaign, IL USAships worldwide |
| Stock # | 95403-20 |
| Ship Weight | 3 lbs /ea |
| Condition | Used and in Excellent Condition |
| Inspection | Before every shipment |
| Warranty | 1-Year Warranty with 30-Day Return Guarantee |
Description
Installed:
• Rohde & Schwarz A41 Display Board; Part Number: 1065.7764.02
• Toshiba LTM10C209A LCD Screen Display Panel; Part Number:NRL75-8809A-113, NRL75-8809A-114 (Rohde & Schwarz Part Number: 0048.4235.00)
• Hitachi VNR10C209-INV Inverter
Part Number: 1127.9641.00
• Rohde & Schwarz A41 Display Board; Part Number: 1065.7764.02
• Toshiba LTM10C209A LCD Screen Display Panel; Part Number:NRL75-8809A-113, NRL75-8809A-114 (Rohde & Schwarz Part Number: 0048.4235.00)
• Hitachi VNR10C209-INV Inverter
Part Number: 1127.9641.00
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Rohde & Schwarz 1127.9641.00 Front Panel Display for ZVM Vector Network Analyzer Overview
Features:
- Excellent Dynamic Range
- Low Inherent Noise
- High Measurement Speed
- Fast Data Transfer via IEC/IEEE Bus
- Easy Integration Into PC Environment and Networks
The Rohde & Schwarz ZVM/ZVK Vector Network Analyzers are compact instruments
with integrated generator, two reference
and two receiver channels and a bidirectional test set. This can be extended by
attenuators with integrated switches in
the generator and receiver paths. With
this configuration, ZVM and ZVK offer
direct access to all reference and receiver
channels. This concept makes ZVM and
ZVK well equipped for complex test setups, for example for bidirectional measurements on power amplifiers.
The ZVM and ZVK have two independent synthesizers for the generator and the receiver. In the receiver sections, fundamental mixing is used up to high frequencies to provide the excellent dynamic range and outstanding selectivity, enabling straightforward measurements on frequency-converting DUTs or DUTs with extremely high selectivity.
The ZVM and ZVK feature modern calibration techniques patented by Rohde & Schwarz that allow full two-port calibration using fewer or only partially known standards. This simplifies the design of calibration standards used for example in test fixtures or on wafers. Thus calibration in non-coaxial systems can be performed with a minimum of effort at maximum accuracy and dynamic range.
The Virtual Embedding Networks option enables virtual embedding of arbitrary linear two-port networks into the test setup. The required data are obtained from a measurement of the existing network or generated by CAE tools from the theoretical model.
In tests of components that have to be matched to a given impedance, the matching network can thus be taken into account through mathematical algorithms of ZVM and ZVK instead of using the physical network. This method guarantees high accuracy, ideal reproducibility and maximum reliability without any loss of speed - great advantages especially in production.
Conversely, by de-embedding, the influence of a known network can be eliminated. The S-parameters of a chip can be analyzed, compensating for the effects of its housing and bonding leads through de-embedding.
By transforming measurement data from the frequency to the time domain, discontinuities or impedances along the DUT can be displayed as a function of DUT length. With a maximum number of 2001 points, ZVM and ZVK can measure even very long DUTs with high resolution. Five filters allow the location of a discontinuity and the sidelobe suppression to be determined with optimum resolution. The S-parameters of a given discontinuity can be displayed in the time domain by setting a window (gating). An additional processor module included in the corresponding option accelerates data processing and the display of results to provide even realtime display - a valuable aid, for example in the tuning of bandpass filters with time domain transformation.
ZVM and ZVK are based on Windows NT. The user has complete access to the hard disk, the floppy disk drive and all interfaces of the internal PC. This allows, for example, the connection of an external monitor, the installation of any type of printer, or the use of software tools on ZVM or ZVK for result processing or control of the network analyzers via the IEC/ IEEE bus or an internal RSIB*) data bus. ZVM and ZVK can thus act as controllers of their own or for a complete test or production system. Moreover, the internal PC enables control and data exchange via Ethernet.
In the decoupled mode, the frequency grid, measurement bandwidth, calibration technique and measurement mode can be configured independently for each of the four display channels. In amplifier measurements, this allows the simultaneous measurement and display of important parameters in quasi-realtime, such as gain, compression point (power sweep) and harmonics versus power or frequency, or compression point versus frequency.
The Rohde&Schwarz two-port calibration techniques reduce the number of required calibration standards to a minimum of 2. This significantly cuts the time required for manual calibration. The short measurement time of <500 µs or <700 µs per point guarantees minimum sweep times through to realtime display. The output of a marker value via the IEC/IEEE bus takes less than 5 ms, the transfer of a complete trace (200 points) less than 15 ms. These features are the basis for the excellent performance of ZVM and ZVK both in manual operation and in automated test systems.
The ZVM and ZVK have two independent synthesizers for the generator and the receiver. In the receiver sections, fundamental mixing is used up to high frequencies to provide the excellent dynamic range and outstanding selectivity, enabling straightforward measurements on frequency-converting DUTs or DUTs with extremely high selectivity.
The ZVM and ZVK feature modern calibration techniques patented by Rohde & Schwarz that allow full two-port calibration using fewer or only partially known standards. This simplifies the design of calibration standards used for example in test fixtures or on wafers. Thus calibration in non-coaxial systems can be performed with a minimum of effort at maximum accuracy and dynamic range.
The Virtual Embedding Networks option enables virtual embedding of arbitrary linear two-port networks into the test setup. The required data are obtained from a measurement of the existing network or generated by CAE tools from the theoretical model.
In tests of components that have to be matched to a given impedance, the matching network can thus be taken into account through mathematical algorithms of ZVM and ZVK instead of using the physical network. This method guarantees high accuracy, ideal reproducibility and maximum reliability without any loss of speed - great advantages especially in production.
Conversely, by de-embedding, the influence of a known network can be eliminated. The S-parameters of a chip can be analyzed, compensating for the effects of its housing and bonding leads through de-embedding.
By transforming measurement data from the frequency to the time domain, discontinuities or impedances along the DUT can be displayed as a function of DUT length. With a maximum number of 2001 points, ZVM and ZVK can measure even very long DUTs with high resolution. Five filters allow the location of a discontinuity and the sidelobe suppression to be determined with optimum resolution. The S-parameters of a given discontinuity can be displayed in the time domain by setting a window (gating). An additional processor module included in the corresponding option accelerates data processing and the display of results to provide even realtime display - a valuable aid, for example in the tuning of bandpass filters with time domain transformation.
ZVM and ZVK are based on Windows NT. The user has complete access to the hard disk, the floppy disk drive and all interfaces of the internal PC. This allows, for example, the connection of an external monitor, the installation of any type of printer, or the use of software tools on ZVM or ZVK for result processing or control of the network analyzers via the IEC/ IEEE bus or an internal RSIB*) data bus. ZVM and ZVK can thus act as controllers of their own or for a complete test or production system. Moreover, the internal PC enables control and data exchange via Ethernet.
In the decoupled mode, the frequency grid, measurement bandwidth, calibration technique and measurement mode can be configured independently for each of the four display channels. In amplifier measurements, this allows the simultaneous measurement and display of important parameters in quasi-realtime, such as gain, compression point (power sweep) and harmonics versus power or frequency, or compression point versus frequency.
The Rohde&Schwarz two-port calibration techniques reduce the number of required calibration standards to a minimum of 2. This significantly cuts the time required for manual calibration. The short measurement time of <500 µs or <700 µs per point guarantees minimum sweep times through to realtime display. The output of a marker value via the IEC/IEEE bus takes less than 5 ms, the transfer of a complete trace (200 points) less than 15 ms. These features are the basis for the excellent performance of ZVM and ZVK both in manual operation and in automated test systems.
The Rohde & Schwarz 1127.9641.00 Front Panel Display for ZVM Vector Network Analyzer may still be available for purchase and support from Artisan Technology Group beyond End-Of-Life (EOL) by the manufacturer (OEM).
Front Panel Display for ZVM Vector Network Analyzer Price & Specs
Rohde & Schwarz 1127.9641.00 Front Panel Display for ZVM Vector Network Analyzer Description
Functions
Provides visual interface for vector network analyzer control and measurement display, featuring LCD or LED screen technology for parameter visualization including S-parameters, Smith charts, polar plots, and measurement data. Enables operator interaction through integrated touchscreen or button interface for frequency sweep configuration, calibration procedures, marker placement, and trace analysis. Displays real-time measurement results, system status indicators, and menu navigation for network parameter characterization of RF and microwave devices under test.
Platforms
Designed for integration with ZVM Vector Network Analyzer mainframes requiring external display interfaces. Mounts to standard 19-inch rack systems or benchtop configurations. Connects via proprietary multi-pin connector providing video signal transmission and control communications. Compatible with automated test equipment racks supporting remote operation capabilities. Interfaces with measurement stations requiring real-time parameter visualization during RF and microwave component characterization. Supports laboratory environments with controlled EMI specifications and standard AC power distribution systems.
Applications
Enables real-time visualization of complex S-parameter measurements, including magnitude, phase, Smith charts, and polar plots. Supports direct interactive configuration and control of measurement parameters, calibration routines, and data display formats. Facilitates immediate feedback for RF component characterization, filter tuning, antenna impedance matching, and material dielectric analysis during stand-alone operation or in environments where external display/PC interfaces are impractical.
Accessories
Front panel display module designed for integration with the ZVM Vector Network Analyzer; required mainframe: ZVM VNA main unit; interfaces include RF test ports (typically 3.5 mm connectors for 50 ohm), generator port, reference and receiver channels; optional accessory modules include AutoCal device (DC-8 GHz), 3- and 4-port adapters for extended measurement capabilities; also Ethernet and IEC/IEEE bus interfaces for internal PC connectivity; physical connectors predominantly coaxial 3.5 mm type for RF ports; control and data transfer via instrument bus and Ethernet where applicable.
Interfaces
15-pin VGA DE-15 female for video, 5-pin DIN for keyboard, BNC female for trigger input, BNC female for trigger output.
Specifications
Integrated human-machine interface module for visual presentation of RF/microwave measurement data, instrument status, and control menus for a modular Vector Network Analyzer system. Operates as a direct accessory, receiving processed data via internal bus for real-time trace display, numerical results, and softkey menu navigation. Enables operator interaction for configuration and analysis during component characterization, material science, and high-frequency circuit evaluation in laboratory and production environments.
This section includes content generated with the assistance of artificial intelligence (AI) tools. AI is used to increase efficiency and provide timely information. Please note that the content may not have been reviewed for accuracy or completeness. Use this information at your own discretion, and verify details independently as needed.
Rohde & Schwarz 1127.9641.00 Front Panel Display for ZVM Vector Network Analyzer Manuals, Datasheets, Drivers, Links
Rohde & Schwarz 1127.9641.00 Front Panel Display for ZVM Vector Network Analyzer Specs
| General | |
|---|---|
| Manufacturer | Rohde & Schwarz |
| Model | 1127.9641.00 |
| Condition | Used and in Excellent Condition |
| Product Family | ZVM, ZVK |
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Important Notice: Other accessories, manuals, cables, calibration data, software, etc. are not included with this equipment unless listed in the above stock item description. All prices are shown in USD.
Artisan Scientific Corporation dba Artisan Technology Group is not affiliated with or a distributor for Rohde & Schwarz. The depiction, description, or sale of products featuring names, trademarks, brands, and logos is for identification and/or reference purposes only and does not indicate any affiliation with or authorization by any rights holder.
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