Keysight / Agilent 4145A Semiconductor Parameter Analyzer
Stock # 59126-1
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Keysight / Agilent 4145A / 4145B Semiconductor Parameter Analyzer
Features
- Four Programmable Stimulus/Measurement Units
- Fully Interactive Graphics Display
- Removable Flexible-Disc Storage
- ...
- Front Panel Softkeys Allow Quick and Easy Operation
Description
The Hewlett-Packard Model 4145A Semiconductor Parameter Analyzer is a fully automatic, high performance, programmable test instrument designed to measure, analyze, and graphically display the DC... characteristics of a wide range of semiconductor devices, such as diodes, bipolar transistors, field-effect transistors, wafers, ICs, etc. Main applications include computer-aided design (CAD) of ICs, new device evaluation, materials evaluation, component selection for circuit design, incoming/outgoing inspection, semiconductor process control, quality control, and quality assurance.It is equipped with four programmable stimulus/measurement units (SMU), two programmable voltage source units (Vs), two voltage monitor units (Vm), a fully interactive graphics display, removable flexible-disc storage, softkeys, full arithmetic keyboard, and HP-IB.
Each SMU channel has three modes of operation: voltage source/current monitor (V), current source/voltage monitor (I), and common (COM). Source voltage and source current can be held constant or swept linearly or logarithmically.
Measurement results, measurement setups, operator prompts, error messages, and diagnostics are displayed on a fully interactive, microprocessor based graphics display. Measurement results can be displayed in one of four modes: graphic, list, matrix, and schmoo.The Hewlett-Packard Model 4145A Semiconductor Parameter Analyzer is a fully automatic, high performance, programmable test instrument designed to measure, analyze, and graphically display the DC characteristics of a wide range of semiconductor devices, such as diodes, bipolar transistors, field-effect transistors, wafers, ICs, etc. Main applications include computer-aided design (CAD) of ICs, new device evaluation, materials evaluation, component selection for circuit design, incoming/outgoing inspection, semiconductor process control, quality control, and quality assurance.
It is equipped with four programmable stimulus/measurement units (SMU), two programmable voltage source units (Vs), two voltage monitor units (Vm), a fully interactive graphics display, removable flexible-disc storage, softkeys, full arithmetic keyboard, and HP-IB.
Each SMU channel has three modes of operation: voltage source/current monitor (V), current source/voltage monitor (I), and common (COM). Source voltage and source current can be held constant or swept linearly or logarithmically.
Measurement results, measurement setups, operator prompts, error messages, and diagnostics are displayed on a fully interactive, microprocessor based graphics display. Measurement results can be displayed in one of four modes: graphic, list, matrix, and schmoo.The Hewlett-Packard Model 4145A Semiconductor Parameter Analyzer is a fully automatic, high performance, programmable test instrument designed to measure, analyze, and graphically display the DC characteristics of a wide range of semiconductor devices, such as diodes, bipolar transistors, field-effect transistors, wafers, ICs, etc. Main applications include computer-aided design (CAD) of ICs, new device evaluation, materials evaluation, component selection for circuit design, incoming/outgoing inspection, semiconductor process control, quality control, and quality assurance.
It is equipped with four programmable stimulus/measurement units (SMU), two programmable voltage source units (Vs), two voltage monitor units (Vm), a fully interactive graphics display, removable flexible-disc storage, softkeys, full arithmetic keyboard, and HP-IB.
Each SMU channel has three modes of operation: voltage source/current monitor (V), current source/voltage monitor (I), and common (COM). Source voltage and source current can be held constant or swept linearly or logarithmically.
Measurement results, measurement setups, operator prompts, error messages, and diagnostics are displayed on a fully interactive, microprocessor based graphics display. Measurement results can be displayed in one of four modes: graphic, list, matrix, and schmoo.
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