Configuration:
• End User Option: 9750-0010-00
Part Number: 9750-0051-01
* If you would like to purchase a specific component of this unit, please contact Artisan Technology Group Sales.
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Important Notice: Please note that any additional items included with this equipment such as accessories, manuals, cables, calibration data, software, etc. are specifically listed in the above stock item description and/or displayed in the photos of the equipment. Please contact one of our Customer Support Specialists if you have any questions about what is included with this equipment or if you require any additional information.
Features:
- 325 nm Laser and White Light Optical System
- Four White Light Objectives 5x, 50x, 100, and 150x
- 325nm 100x UV Objective
- High-Resolution Color CCD Camera
- 24-bit Integrated White Light Package
- Precision XYZ Stage
- Automatic Deskew
- Dual Pentium PC with Jaz Drive
- Auxillary 13 Inch Video Monitor
- NFS SW Interface for Ethernet
- Tencor File Format Interface
- KLARF Format Interface
- Integrated Mini-Environment
- Exhaust Blower With Interconnect Ducts
- 300mm Wafer Handler with Integrated 300mm Asyst Loadports and Hermos Carrier ID readers
- SEMI Communication/Automation Standards: E84, E87, E40, E90 and E94
- GEM/SECS 232 (SEMI-E4, E5 and E30)
- Impact ADC option
The KLA-Tencor Confocal Review Station (CRS) is an automated laser/white light microscope system used for classification of defects on both bare and patterned wafers, using defect maps generated by a variety of instruments. The CRS combines a brightfield/darkfield white-light microscope with a laser confocal microscope, automated wafer handling, and controlling software.
The CRS can display any combination of a 2D focal plane image, a 3D surface image rotated to any orientation, any horizontal slice of a volume image, and vertical 2D cuts through any of the 3D images in XZ or YZ planes. The laser scan amplitude can vary for 1x, 2x, 4x, or 8x zoom within the same magnification of the microscope, providing on-screen magnification up to 20,000x with a 100x objective at Zoom level 8.
An important feature of the confocal microscope is its extremely narrow depth of focus in laser light, which makes it possible to view images of individual layers in semiconductor structures, and to resolve structural and defect features as small as 0.15 µm.
The CRS can be configured from fully manual operation to fully automated operation. There are manual and automatic options for cassette loading, wafer loading, deskew, defect inspection and analysis, image capture, data storage, and communication. The CRS can run automatically using locally stored recipes, or can receive commands and respond to them over a network.
Artisan Scientific Corporation dba Artisan Technology Group is not affiliated with or a distributor for Asyst Technologies. The depiction, description, or sale of products featuring names, trademarks, brands, and logos is for identification and/or reference purposes only and does not indicate any affiliation with or authorization by any rights holder.
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