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GC5050-1M Marvin Test Systems Dynamically Controlled High Speed Digital I/O PCI Card

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1 In StockAvailable today · ships from Champaign, IL
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Item: Marvin Test Systems / Geotest GC5050-1M Dynamically Controlled High Speed Digital I/O PCI Card · Stock # 90905-1

Item details
Part NumberGC5050-1M
In Stock1
AvailableToday
LocationChampaign, IL USAships worldwide
Stock #90905-1
Ship Weight10 lbs /ea
ConditionUsed and in Excellent Condition
InspectionBefore every shipment
Warranty1-Year Warranty with 30-Day Return Guarantee
Description
Configuration:
• Channel Memory: 1 Mb
• (3) 9132X-005 4 MB Memory Modules
• I/O Option: GC5960 LVDS I/O Module

Part Number: 233100
Stacey Z.Artisan product specialist

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Item to Inspect: 90905-1 - Marvin Test Systems / Geotest GC5050-1M Dynamically Controlled High Speed Digital I/O PCI Card

More Information

Marvin Test Systems / Geotest GC5050-1M Dynamically Controlled High Speed Digital I/O PCI Card Overview

Features:

  • 32 Bi-Directional I/O Pins (16 Cards May be Daisy-Chained for a Total of 512 Pins)
  • 3 MB or 12 MB of On-Board Memory
  • External and Programmable Internal Clock Rates from 5 Hz to 50 MHz
  • Dynamically Controlled Sequencer Supports Branching, Looping, and Subroutines
The Marvin Test Systems / Geotest GC5050 Dynamically Controlled High Speed Digital I/O PCI Card is a high speed Dynamic Digital I/O card that provides capabilities comparable to high speed I/O products found in large functional test systems. The card shares an identical architecture with the GX5050, a 6U PXI card. Both have the ability to operate independently of the host computer when in the RUN mode.

The GC5050 provides real-time digital stimulus and capture with 32 pins per card. Up to 16 cards can be daisy-chained for a total of up to 512 pins. The 32 pins can be configured as input or output groups of eight. The direction of each group can be changed dynamically with the sequencer, externally, or both. There is also a 16-bit external bus for triggering and synchronization with external events.

Clock and strobe signals are distributed to the cards via a daisychained ribbon cable. These signals can be generated internally or externally. The external control signals allow full synchronization with the unit under test (UUT) and minimize the initialization part of the test.

The Marvin Test Systems GC5050-1M Dynamically Controlled High Speed Digital I/O PCI Card may still be available for purchase and support from Artisan Technology Group beyond End-Of-Life (EOL) by the manufacturer (OEM).

Dynamically Controlled High Speed Digital I/O PCI Card Price & Specs

Marvin Test Systems / Geotest GC5050-1M Dynamically Controlled High Speed Digital I/O PCI Card Manuals, Datasheets, Drivers, Links

Marvin Test Systems / Geotest GC5050-1M Dynamically Controlled High Speed Digital I/O PCI Card Specs

General
ManufacturerMarvin Test Systems
ModelGC5050-1M
ConditionUsed and in Excellent Condition
Product FamilyGC5050, 233100, GC5050 DIO, GC5050DIO

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Important Notice: Other accessories, manuals, cables, calibration data, software, etc. are not included with this equipment unless listed in the above stock item description. All prices are shown in USD.

Artisan Scientific Corporation dba Artisan Technology Group is not affiliated with or a distributor for Marvin Test Systems. The depiction, description, or sale of products featuring names, trademarks, brands, and logos is for identification and/or reference purposes only and does not indicate any affiliation with or authorization by any rights holder.

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