SR2520GP Interface Technology Guided Probe Module

The SR2520GP Guided Probe Module provides the capability to probe nodes on the UUT, measure the state response, and determine pass / fail conditions. Adding the Guided Probe to the SR2500 Digital Test Subsystem does not diminish the available I/O pin count. Instead, the Guided Probe actually adds 20 additional clocks, triggers and sync to the SR2500.

The Guided Probe is capable of testing and detecting high, low and indeterminate states. It can also calculate a CRC checksum based on the input stream, detect pulses and make static measurements of analog voltages. Upon determination of the pass / fail state, the Guided Probe will store the information from the node, the results of the real-time compare between the measured response and the expected response, and information indicating if the node is actively driven or tristated. The Guided Probe will also store the state of a 24-bit vector counter (time tag) and a 4-bit, user defined tag.

The probe itself uses an active input to reduce circuit loading on the test node and to condition the UUT signal prior to routing it to the Guided Probe logic within the SR2520 Expansion Module. An activation switch is located on the probe to trigger or continue test execution.