PI-4001 Pulse Instruments Control Mainframe

The 4000 Series Clock Driver and Low Noise DC Bias System was designed specifically for the stringent requirements necessary for the testing of Charge Coupled Devices (CCD's), IR Detectors, and Focal Plane Arrays (FPAs).It provides high accuracy, low noise clock drivers and DC biases with the capability to drive almost every CCD and IR Detector Array manufactured to date. All clock drivers and Bias supplies are independently programmable.

The system uses separate mainframes to isolate the digital electronics used to program and control the instrument from the DC Bias and clock driver cards. This isolation is accomplished both optically and through the use of separate power sources, providing a very high level of noise immunity for the clock drivers and DC biases.

The separate mainframe structure allows the clock drivers and DC bias supplies located in the PI-4002 Instrument Mainframe to be located in close proximity to the Device Under Test (DUT), if desired, while the digital electronics located in the Control Mainframe can be placed in a more remote area.

There is also protection against transients that could damage your DUT. When the power is turned on or off, the output voltage levels on all drivers and bias supplies are held within the range of ±3 volts.

The system requires one Control Mainframe, at least one PI-4002 Instrument Mainframe, and a PI-4003 DC Power Mainframe.